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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 171 to 180 of 220 records.
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171. Characterization of TiO2 Memristors on Flexible Substrates
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/19/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906390

172. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067

173. Challenges and Opportunities of Organic Electronics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

174. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui H. Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905318

175. Calibration of 1 nm SiC Step Height Standards
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/31/2010
Authors: Theodore Vincent Vorburger, Albert M. Hilton, Ronald G Dixson, Ndubuisi George Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
Abstract: We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is the calibration of atomic force microscopes operating at their highest levels of magnifi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905193

176. Organic Electronics: Challenges and Opportunities
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

177. Characterization of Soluble Anthradithiophene Derivatives
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/18/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, John E Anthony, David J Gundlach
Abstract: We will discuss the growth and electrical measurements of a newly developed, partially fluorinated anthradithiophene (F-ADT) derivative with tert-butyldiphenylsilyl (TBDMS) side groups. Single crystals of the material can be readily grown and device ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905386

178. Flip Chip Lamination Approach to Fabricate Top Metal Contacts on Organic-based Devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
Abstract: Flip Chip Lamination approach to fabricate top metal contacts on organic-based devices ; M.Coll, O.D. Jurchescu, N. Gergel-Hackett, C.A. Richter, C,A, Hacker, American Physical Society (APS), March 2010, Portland, OR, USA (oral)
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907069

179. Spatial Resolution of Electrical Measurements Performed with Scanning Probe Microscope as a Function of Tip Shape
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2010
Authors: Joseph J Kopanski, Ilona Sitnitsky, Vincent LaBella
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905391

180. Analysis of Au Nanoparticles by Electrospray Differential Mobility Analysis (ES-DMA)
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/1/2010
Author: Rebecca A Zangmeister
Abstract: This document describes a protocol for size analysis of citrate stabilized gold nanoparticles of nominally 10 nm, 30 nm, and 60 nm sizes using electrospray differential mobility analysis (ES-DMA).  Nanoparticles are centrifuged to remove excess ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832212



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