NIST logo

Publications Portal

You searched on:
Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 141 to 150 of 199 records.
Resort by: Date / Title


141. Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/20/2010
Authors: Elisabeth Mansfield, Aparna Kar, Stephanie A Hooker
Abstract: A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905333

142. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

143. Nanomechanical standards based on the intrinsic mechanics of molecules and atoms
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Douglas T Smith
Abstract: For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905416

144. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

145. Mechanical properties of one-dimensional nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902063

146. Relationships between Composition and Density of Tobermorite, Jennite, and Nanoscale CaO-SiO2-H2O
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/16/2010
Authors: Andrew John Allen, Jeffrey Thomas, Hamlin M Jennings
Abstract: Relationships between composition, mass density, and atomic packing density for CaO{SiO2{H2O (C{S{H) gel, the main hydration product of ce- ment, and its mineral analogues tobermorite and jennite, are examined. A phase diagram approach is proposed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903643

147. Microstructural Evolution of Pd-doped Nanoscale Zero-valent Iron (nZVI) Particles in Aqueous Media and Implications for Particle Reactivity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/6/2010
Authors: Andrew A Herzing, Weile Yan, Christopher J. Kiely, Wei-xian Zhang
Abstract: Palladized zero-valent iron nanoparticles have been frequently employed to achieve enhanced treatment of halogenated organic compounds. However no detailed study has been published on their structures, especially the distribution of palladium within ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904152

148. Advanced Capacitance Metrology for Nanoscale Device Characterization
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391

149. Probing the Nanoscale
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/23/2010
Author: Robert Francis Cook
Abstract: Nanoscale probes can now measure all manner of nanomechanical properties, opening up opportunities for new science and new devices.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905145

150. Characterization of TiO2 Memristors on Flexible Substrates
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/19/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906390



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series