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Topic Area: Statistics
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Displaying records 101 to 108.
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101. Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence
Series: Journal of Research (NIST JRES)
Topic: Statistics
Published: 11/1/2003
Authors: Raghu N Kacker, Raju Vsnu Datla, Albert C Parr
Abstract: This paper responds to comments received by the authors on the paper, Combined Result and Associated Uncertainty from Interlaboratory Evaluations Based on the ISO Guide that appeared in Metrologia, 2002, 39, 279-293.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150873

102. Adaptive Characterization of Jitter Noise in Sampled High-Speed Signals
Topic: Statistics
Published: 10/1/2003
Authors: Kevin J Coakley, Chih-Ming Wang, Paul D Hale, Tracy S. Clement
Abstract: We estimate the root-mean-square (RMS) value of timing jitter noise in simulated signals similar to measured high-speed sampled signals. The simulated signals are contaminated by additive noise, timing jitter noise, and time shift errors. Before e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51084

103. A Statistical Model for Cladding Diameter of Optical Fibers
Topic: Statistics
Published: 4/1/2003
Authors: Chih-Ming Wang, Timothy J Drapela
Abstract: The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of optical-fiber outer diameter. The contact micrometer is used to measure reference fibers which are artifacts used by the telecommunicat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151779

104. NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis
Topic: Statistics
Published: 3/1/2001
Authors: Charles Martin Guttman, S Wetzel, William R. Blair, B M Fanconi, Kathleen M. Flynn, R J Goldschmidt, William E Wallace III, David Lloyd VanderHart
Abstract: Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851614

105. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
Series: ITL Bulletin
Topic: Statistics
Published: 12/20/2000
Author: Elaine B Barker
Abstract: Random and pseudorandom numbers are needed for many cryptographic applications. For example, common cryptosystems employ keys that must be generated in a random fashion. Many cryptographic protocols also require random or pseudorandom inputs at var ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151231

106. Randomness Testing of the Advanced Encryption Standard Finalist Candidates
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6483
Topic: Statistics
Published: 4/1/2000
Authors: Juan Soto, Lawrence E Bassham
Abstract: Mars, RC6, Rijndael, Serpent and Twofish were selected as finalists for the Advanced Encryption Standard (AES). To evaluate the finalists' suitability as random number generators, empirical statistical testing is commonly employed. Although it widely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151216

107. Randomness Testing of the Advanced Encryption Standard Candidate Algorithms
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6390
Topic: Statistics
Published: 9/1/1999
Author: Juan Soto
Abstract: One of the criteria used to evaluate the Advanced Encryption Standard candidate algorithms was their demonstrated suitability as random number generators. That is, the evaluation of their output utilizing statistical tests should not provide any mean ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151193

108. Statistical Analysis of NIST Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by MALDI TOF MS
Topic: Statistics
Published: 1/1/1999
Authors: S Wetzel, Charles Martin Guttman, Kathleen M. Flynn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853725



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