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Displaying records 41 to 50 of 68 records.
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41. Hamiltonian Paths Through Two- and Three-Dimensional Grids
Series: Journal of Research (NIST JRES)
Report Number: of
Topic: Software
Published: 4/1/2005
Author: William F Mitchell
Abstract: This paper addresses the existence of Hamiltonian paths and cycles in two-dimensional grids consisting of triangles or quadrilaterals, and three-dimensional grids consisting of tetrahedra or hexahedra. The paths and cycles may be constrained to pass ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50021

42. Hybrid shape descriptor and meta similarity generation for non-rigid and partial 3D model retrieval
Topic: Software
Published: 7/26/2013
Author: Afzal A Godil
Abstract: Non-rigid and partial 3D model retrieval are two significant and challenging research directions in the field of 3D model retrieval. Little work has been done in proposing a hybrid shape descriptor that works for both retrieval scenarios, let alone ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913720

43. IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Topic: Software
Published: 11/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combination ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50964

44. IPOG: A General Strategy for t-Way Software Testing
Topic: Software
Published: 3/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50944

45. Identifying Failure-Inducing Combinations in a Combinatorial Test Set
Topic: Software
Published: 4/17/2012
Author: Raghu N Kacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911457

46. Isolating Failure-Inducing Combinations in Combinatorial Testing using Test Augmentation and Classification
Topic: Software
Published: 4/21/2012
Authors: Kiran Shakya, Tao Xie, Nuo Li, Yu Lei, Raghu N Kacker, David R Kuhn
Abstract: Combinatorial Testing (CT) is a systematic way of sampling input parameters of the software under test (SUT). A t-way combinatorial test set can exercise all behaviors of the SUT caused by interactions between t input parameters or less. Although com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911450

47. Just Try
Topic: Software
Published: 11/1/2011
Author: Isabel M Beichl
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909403

48. LDPC Error Correction in the Context of Quantum Key Distribution
Topic: Software
Published: 4/23/2012
Author: Anastase Nakassis
Abstract: Secret keys can be established through the use of Quantum channels monitored through classical channels which can be thought of as being error free. Because many of the feasible implementation of the quantum channel are subject to erasures ‹often mas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910418

49. MGGHAT User's Guide Version 1.1
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5948
Topic: Software
Published: 1/1/1997
Author: William F Mitchell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900802

50. Modeling Microstructures with OOF2
Topic: Software
Published: 9/1/2009
Authors: Andrew Charles edmu Reid, Rhonald Lua, R E Garcia, Valerie R. Coffman, Stephen A Langer
Abstract: OOF2 is a program for computing the properties and behavior of material microstructures, beginning with an image of the microstructural geometry. OOF2 uses finite elements, but is designed to be used by materials scientists with little or no finite e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51176



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