NIST logo

Publications Portal

You searched on:
Topic Area: Software
Sorted by: title

Displaying records 41 to 50 of 70 records.
Resort by: Date / Title

41. Fitting Weighted Total Least-Squares Planes and Parallel Planes to Support Tolerancing Standards
Topic: Software
Published: 10/19/2012
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present elegant algorithms for fitting a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems is reduced to a ...

42. Gauging the Repeatability of 3D Imaging Systems by Sphere Fitting
Topic: Software
Published: 9/30/2009
Authors: Marek Franaszek, Geraldine S Cheok, Kamel Shawki Saidi
Abstract: Multiple scans of the same object acquired with 3D imaging system (e.g., laser scanner) in the same experimental conditions could provide valuable information about the instrument s performance (e.g., stability, existence of bias, measurement error). ...

43. Hamiltonian Paths Through Two- and Three-Dimensional Grids
Series: Journal of Research (NIST JRES)
Report Number: of
Topic: Software
Published: 4/1/2005
Author: William F Mitchell
Abstract: This paper addresses the existence of Hamiltonian paths and cycles in two-dimensional grids consisting of triangles or quadrilaterals, and three-dimensional grids consisting of tetrahedra or hexahedra. The paths and cycles may be constrained to pass ...

44. Hybrid shape descriptor and meta similarity generation for non-rigid and partial 3D model retrieval
Topic: Software
Published: 7/26/2013
Author: Afzal A Godil
Abstract: Non-rigid and partial 3D model retrieval are two significant and challenging research directions in the field of 3D model retrieval. Little work has been done in proposing a hybrid shape descriptor that works for both retrieval scenarios, let alone ...

45. IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Topic: Software
Published: 11/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combination ...

46. IPOG: A General Strategy for t-Way Software Testing
Topic: Software
Published: 3/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In t ...

47. Identifying Failure-Inducing Combinations in a Combinatorial Test Set
Topic: Software
Published: 4/17/2012
Author: Raghu N Kacker

48. Isolating Failure-Inducing Combinations in Combinatorial Testing using Test Augmentation and Classification
Topic: Software
Published: 4/21/2012
Authors: Kiran Shakya, Tao Xie, Nuo Li, Yu Lei, Raghu N Kacker, David R Kuhn
Abstract: Combinatorial Testing (CT) is a systematic way of sampling input parameters of the software under test (SUT). A t-way combinatorial test set can exercise all behaviors of the SUT caused by interactions between t input parameters or less. Although com ...

49. Just Try
Topic: Software
Published: 11/1/2011
Author: Isabel M Beichl

50. LDPC Error Correction in the Context of Quantum Key Distribution
Topic: Software
Published: 4/23/2012
Author: Anastase Nakassis
Abstract: Secret keys can be established through the use of Quantum channels monitored through classical channels which can be thought of as being error free. Because many of the feasible implementation of the quantum channel are subject to erasures ‹often mas ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series