NIST logo

Publications Portal

You searched on: Topic Area: Software Sorted by: title

Displaying records 41 to 50 of 74 records.
Resort by: Date / Title


41. Fast Sequential Importance Sampling fo Estimate the Graph Reliability Polynomial
Topic: Software
Published: 11/8/2012
Authors: David G. Harris, Francis Sullivan, Isabel M Beichl
Abstract: The reliability polynomial of a graph measures the number of its connected subgraphs of various sizes. Algortihms based on sequential importance sampling (SIS) have been proposed to estimate a graph's reliahbility polynomial. We develop an improved ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905927

42. Fault Localization Based on Failure-Inducing Combinations
Topic: Software
Published: 11/7/2013
Author: Raghu N Kacker
Abstract: Combinatorial testing has been shown to be a very effective testing strategy. After a failure is detected, the next task is to identify the actual fault that causes the failure. In this paper, we present an approach to fault localization that le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913018

43. Feature-preserved 3D Canonical Form
Topic: Software
Published: 7/28/2012
Authors: Afzal A Godil, Zhouhui Lian
Abstract: Abstract Measuring the dissimilarity between non-rigid objects is a challenging problem in 3D shape retrieval. One potential solution is to construct the models‰ 3D canonical forms (i.e., isometry-invariant representations in 3D Euclidean domain) on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911523

44. Fitting Weighted Total Least-Squares Planes and Parallel Planes to Support Tolerancing Standards
Topic: Software
Published: 10/19/2012
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present elegant algorithms for fitting a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems is reduced to a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911379

45. Gauging the Repeatability of 3D Imaging Systems by Sphere Fitting
Topic: Software
Published: 9/30/2009
Authors: Marek Franaszek, Geraldine S Cheok, Kamel S Saidi
Abstract: Multiple scans of the same object acquired with 3D imaging system (e.g., laser scanner) in the same experimental conditions could provide valuable information about the instrument s performance (e.g., stability, existence of bias, measurement error). ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903444

46. Hamiltonian Paths Through Two- and Three-Dimensional Grids
Series: Journal of Research (NIST JRES)
Report Number: of
Topic: Software
Published: 4/1/2005
Author: William F Mitchell
Abstract: This paper addresses the existence of Hamiltonian paths and cycles in two-dimensional grids consisting of triangles or quadrilaterals, and three-dimensional grids consisting of tetrahedra or hexahedra. The paths and cycles may be constrained to pass ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50021

47. Hybrid shape descriptor and meta similarity generation for non-rigid and partial 3D model retrieval
Topic: Software
Published: 7/26/2013
Author: Afzal A Godil
Abstract: Non-rigid and partial 3D model retrieval are two significant and challenging research directions in the field of 3D model retrieval. Little work has been done in proposing a hybrid shape descriptor that works for both retrieval scenarios, let alone ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913720

48. IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Topic: Software
Published: 11/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combination ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50964

49. IPOG: A General Strategy for t-Way Software Testing
Topic: Software
Published: 3/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50944

50. Identifying Failure-Inducing Combinations in a Combinatorial Test Set
Topic: Software
Published: 4/17/2012
Author: Raghu N Kacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911457



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series