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Displaying records 31 to 40 of 65 records.
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31. A Survey of hp-Adaptive Strategies for Elliptic Partial Differential Equations
Topic: Software
Published: 1/3/2011
Authors: William F Mitchell, Marjorie A McClain
Abstract: The hp version of the finite element method (hp-FEM) combined with adaptive mesh refinement is a particularly efficient method for solving partial differential equations because it can achieve a convergence rate that is exponential in the number of d ...

32. Changes
Topic: Software
Published: 1/3/2011
Author: Isabel M Beichl

33. Bicubic B-Spline Surface Approximation of Invariant Tori
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7731
Topic: Software
Published: 10/20/2010
Authors: Sita Ramamurti, David E. Gilsinn
Abstract: The invariant torus of a coupled system of Van der Pol oscillators is approximated using bicubic B-splines. The paper considers the case of strong nonlinear coupling. In particular, the shapes of invariant torii for the Van der Pol coupling parameter ...

34. Predicting Microstructure Development During Casting of Drug Eluting Coatings
Topic: Software
Published: 9/19/2010
Authors: David M. Saylor, Jonathan E Guyer, Daniel Wheeler, James A Warren
Abstract: We have devised a novel diffuse interface formulation to model the development of chem- ical and physical inhomogeneities, i.e. microstructure, during the process of casting drug eluting coatings. These inhomogeneities, which depend on the ...

35. The hp-Multigrid Method Applied to hp-Adaptive Refinement of Triangular Grids
Topic: Software
Published: 3/16/2010
Author: William F Mitchell
Abstract: Recently the hp version of the finite element method has received increasing attention. This is an adaptive finite element approach in which adaptivity occurs in both the size, h, of the elements and in the order, p, of the approximating piecewise ...

36. A Collection of 2D Elliptic Problems for Testing Adaptive Algorithms
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7668
Topic: Software
Published: 2/26/2010
Author: William F Mitchell
Abstract: Adaptive grid refinement is a critical component of the improvements that have recently been made in algorithms for the numerical solution of partial differential equations (PDEs). The development of new algorithms and computer codes for the solutio ...

37. Tensor Product B-spline Mesh Generation for Accurate Surface Visualizations in the NIST Digital Library of Mathematical Functions
Topic: Software
Published: 2/12/2010
Authors: Bonita V Saunders, Qiming Wang
Abstract: We discuss the use of tensor product B-spline meshes to design accurate three dimensional graphs of high level mathematical functions for the National Institute of Standards and Technology (NIST) Digital Library of Mathematical Functions. The graph ...

38. Artificial Intelligence Tools for Failure Event Data Management and Probability Risk Analysis for Failure Prevention
Topic: Software
Published: 10/25/2009
Authors: Jeffrey T Fong, Pedro Vincente Marcal
Abstract: Over the last thirty years, much research has been done on the development of failure event databases and fatigue modeling of crack growth in pressure vessels and piping. According to a USNRC report (NUREG/CR6674, 2000), results of a fatigue crack g ...

39. Spectrum Simulation in DTSA-II
Report Number: 832430
Topic: Software
Published: 10/1/2009
Author: Nicholas W m Ritchie
Abstract: Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and how to optimize the tools for the optimal measurement. DTSA- ...

40. Gauging the Repeatability of 3D Imaging Systems by Sphere Fitting
Topic: Software
Published: 9/30/2009
Authors: Marek Franaszek, Geraldine S Cheok, Kamel Shawki Saidi
Abstract: Multiple scans of the same object acquired with 3D imaging system (e.g., laser scanner) in the same experimental conditions could provide valuable information about the instrument s performance (e.g., stability, existence of bias, measurement error). ...

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