NIST logo

Publications Portal

You searched on:
Topic Area: Nanomaterials
Sorted by: date

Displaying records 141 to 150 of 151 records.
Resort by: Date / Title


141. Brillouin light scattering from pumped uniform-precession and low-k magnons in Ni81Fe19
Topic: Nanomaterials
Published: 3/4/2005
Authors: Ward L Johnson, Sudook A Kim, Stephen E Russek, Pavel Kabos
Abstract: A method is presented for performing Brillouin-light-scattering measurements on uniform-precession and low-wave-number (Iow-k) magnons excited by a microwave magnetic field in opaque magnetic specimens. The optical configuration is similar to that e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50065

142. Multiscale Green's Function Modeling of Defects in a Semi-Infinite Silicon Substrate
Topic: Nanomaterials
Published: 3/3/2005
Authors: B. Yang, Vinod K Tewary
Abstract: We have developed a Green's function (GF) based multiscale modeling of defects in a semi-infinite Si-substrate. Point defects and substrate surface (i.e., extended defect) at two different scales are modeled in a unified manner. Behaviors of the poin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50032

143. Development of Multilayer Analyzer Array Detectors for X-ray Fluorescence at the Third Generation Synchrotron Source
Topic: Nanomaterials
Published: 8/5/2004
Authors: Z M Zhang, G Rosenbaum, Q Liu, Daniel A Fischer
Abstract: It is a natural to use multilayer analyzers as energy resolving x-ray fluorescence detection in the lower energy region to use multilayer analyzers. The analyzer array detectors can afford large detection solid angle, superb energy resolution, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851001

144. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Topic: Nanomaterials
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853237

145. Atomic Force Acoustic Microscopy Methods to Determine Thin-Film Elastic Properties
Topic: Nanomaterials
Published: 8/1/2003
Authors: Donna C. Hurley, K Shen, N Jennett, J Turner
Abstract: We discuss atomic force acoustic microscopy (AFAM) methods to determine quantitative values for the elasticproperties of thin films. The AFAM approach measures the frequencies of an AFM cantilever's first two flexural resonances while in contact wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851331

146. Laser Ultrasound: An Inspection Tool of Soft Porous Low-Dielectric Constant Films for Microelectronic Interconnect
Topic: Nanomaterials
Published: 3/1/2003
Authors: Colm Flannery, Donna C. Hurley
Abstract: The demand for miniaturization in the microelectronics industry requires that the RC (Resistance-Capacitance) factor be lowered to reduce interconnection delay, crosstalk and power loss. The most promising way to achieve this is by introducing poros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851310

147. Variation of Electrical Properties With Exfoliation Condition in Nanocomposites
Topic: Nanomaterials
Published: 1/1/2002
Authors: M M McBrearty, Anthony J. Bur, S C Roth
Abstract: Dielectric measurements were made on clay filled nylon and polyethylene-ethyl vinyl acetate (PE-EVA) copolymer nanocomposites during processing by extrusion. Nylon without clay had a small dielectric dispersion while PE-EVA did not. The addition of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851958

148. Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source
Topic: Nanomaterials
Published: 10/1/2000
Authors: Chris A Michaels, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831169

149. The Growth Kinetics of Nanocrystalline ZnO Colloidal Solutions
Topic: Nanomaterials
Published: 9/11/1998
Authors: E M Wong, John E Bonevich, P C Searson
Abstract: Colloidal chemistry techniques were used to synthesize ZnO particles in the nanometer size regime. Although the synthesis and unique properties of these materials are well known, the kinetics of the growth process are not well understood. The parti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852862

150. Imperfect Surface Order and Functionalization in Vertical Carbon Nanotube Arrays Probed by Near Edge X-ray Absorption Fine Structure Spectroscoy (NEXAFS)
Topic: Nanomaterials
Published: Date unknown
Authors: T Hemraj-Benny, S Banerjee, S Sambasivan, Daniel A Fischer, G Eres, Alexander Puretzky, David B Geohegan, D H Lowndes, J A Misewich, S S Wong
Abstract: Probing surface order in nanotube systems is of fundamental importance for incorporation of these materials into practical electronic devices. The current study pertains to analysis of the surface orientation of vertically aligned single-walled and m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850857



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series