NIST logo

Publications Portal

You searched on:
Topic Area: Nanomaterials
Sorted by: date

Displaying records 141 to 150 of 154 records.
Resort by: Date / Title

141. Mesoporous nanoparticle TiO2 thin films for conductometric gas sensing on microhotplate plateforms
Topic: Nanomaterials
Published: 1/1/2006
Authors: Kurt D Benkstein, Stephen Semancik

142. Multiscale Modeling of Germanium Quantum Dots in Silicon
Topic: Nanomaterials
Published: 12/30/2005
Authors: Vinod K Tewary, David Thomas Read
Abstract: A method is described for multiscale modeling of a quantum dot in a semiconductor containing a free surface. The method is based upon the use of the lattice-statics and continuum Green's functions integrated with classical molecular dynamics. It full ...

143. Acoustic Modes and Elastic Properties of Polymeric Nanostructures
Topic: Nanomaterials
Published: 10/21/2005
Authors: R Hartschuh, A Kisliuk, V N Novikov, Alexei Sokolov, Paul R Heyliger, Colm Flannery, Ward L Johnson, Christopher L Soles, Wen-Li Wu
Abstract: Fabricating mechanically robust polymer structures with nanoscale dimensions is critical for a wide range of emerging technologies. The rigidity of such structures is expected to change as the feature sizes approach the characteristic dimensions of ...

144. Brillouin light scattering from pumped uniform-precession and low-k magnons in Ni81Fe19
Topic: Nanomaterials
Published: 3/4/2005
Authors: Ward L Johnson, Sudook A Kim, Stephen E Russek, Pavel Kabos
Abstract: A method is presented for performing Brillouin-light-scattering measurements on uniform-precession and low-wave-number (Iow-k) magnons excited by a microwave magnetic field in opaque magnetic specimens. The optical configuration is similar to that e ...

145. Multiscale Green's Function Modeling of Defects in a Semi-Infinite Silicon Substrate
Topic: Nanomaterials
Published: 3/3/2005
Authors: B. Yang, Vinod K Tewary
Abstract: We have developed a Green's function (GF) based multiscale modeling of defects in a semi-infinite Si-substrate. Point defects and substrate surface (i.e., extended defect) at two different scales are modeled in a unified manner. Behaviors of the poin ...

146. Development of Multilayer Analyzer Array Detectors for X-ray Fluorescence at the Third Generation Synchrotron Source
Topic: Nanomaterials
Published: 8/5/2004
Authors: Z M Zhang, G Rosenbaum, Q Liu, Daniel A Fischer
Abstract: It is a natural to use multilayer analyzers as energy resolving x-ray fluorescence detection in the lower energy region to use multilayer analyzers. The analyzer array detectors can afford large detection solid angle, superb energy resolution, and ...

147. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Topic: Nanomaterials
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...

148. Atomic Force Acoustic Microscopy Methods to Determine Thin-Film Elastic Properties
Topic: Nanomaterials
Published: 8/1/2003
Authors: Donna C. Hurley, K Shen, N Jennett, J Turner
Abstract: We discuss atomic force acoustic microscopy (AFAM) methods to determine quantitative values for the elasticproperties of thin films. The AFAM approach measures the frequencies of an AFM cantilever's first two flexural resonances while in contact wit ...

149. Laser Ultrasound: An Inspection Tool of Soft Porous Low-Dielectric Constant Films for Microelectronic Interconnect
Topic: Nanomaterials
Published: 3/1/2003
Authors: Colm Flannery, Donna C. Hurley
Abstract: The demand for miniaturization in the microelectronics industry requires that the RC (Resistance-Capacitance) factor be lowered to reduce interconnection delay, crosstalk and power loss. The most promising way to achieve this is by introducing poros ...

150. Variation of Electrical Properties With Exfoliation Condition in Nanocomposites
Topic: Nanomaterials
Published: 1/1/2002
Authors: M M McBrearty, Anthony J. Bur, S C Roth
Abstract: Dielectric measurements were made on clay filled nylon and polyethylene-ethyl vinyl acetate (PE-EVA) copolymer nanocomposites during processing by extrusion. Nylon without clay had a small dielectric dispersion while PE-EVA did not. The addition of ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series