NIST logo

Publications Portal

You searched on: Topic Area: Ontologies Sorted by: date

Displaying records 31 to 40 of 45 records.
Resort by: Date / Title


31. A Semantic Product Modeling Framework and Language for Behavior Evaluation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7681
Topic: Ontologies
Published: 4/8/2010
Authors: Jae H. Lee, Hyo Won Suh, Steven J. Fenves, Sudarsan Rachuri, Xenia Fiorentini, Ram D Sriram, Conrad E Bock
Abstract: Supporting different stakeholder viewpoints across the product's entire lifecycle requires semantic richness for representing product related information. This paper proposes a multi-layered product modeling framework that enables stakeholders to def ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903952

32. The Semantics of Modules in Common Logic
Topic: Ontologies
Published: 1/20/2010
Author: Fabian M. Neuhaus
Abstract: Common Logic (CL) is an ISO standard that specifies a family of knowledge representation languages. The function of modules within CL is to support local context with a local domains of discourse. Modules play a crucial role since they enable use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904795

33. Ontological Product Modeling for Collaborative Design
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7643
Topic: Ontologies
Published: 10/30/2009
Authors: Conrad E Bock, XuanFang Zha, Hyo Won Suh, Jae H. Lee
Abstract: This paper presents a product modeling language for collaborative design that has the benefits of ontology and expanded capabilities in conventional product modeling. The proposed approach uses ontology to increase flexibility and accuracy in combini ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904119

34. Formal Representation of Product Design Specifications for Validating Product Designs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7626
Topic: Ontologies
Published: 8/27/2009
Authors: Alex Weissman, Satyandra K. Gupta, Xenia Fiorentini, Sudarsan Rachuri, Ram D Sriram
Abstract: Large scale distributed design projects increasingly result in designs that do not fully conform to the stated design goals or specifications. Hence, there is a need to validate these designs against various requirements. For projects with a large se ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902722

35. Towards a Method for Harmonizing Information Standards
Topic: Ontologies
Published: 8/19/2009
Authors: Xenia Fiorentini, Sudarsan Rachuri, Steven R. Ray, Ram D Sriram
Abstract: Designers and engineers use various engineering authoring tools, such as CAD, CAE, and PDM,, to generate information objects (engineering objects). On the business side, enterprise level business process modelers use various business authoring tools, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903057

36. OntoSTEP: OWL-DL Ontology for STEP
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7561
Topic: Ontologies
Published: 5/4/2009
Authors: Sylvere Ismael Krima, Raphael R. Barbau, Xenia Fiorentini, Sudarsan Rachuri, Ram D Sriram
Abstract: The Standard for the Exchange of Product model data (STEP) [1] contains product information mainly related to geometry. The modeling language used to develop this standard, EXPRESS, does not have logical formalism that will enable rigorous semantic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901544

37. Manufacturing Interoperability Program, a Synopsis
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7533
Topic: Ontologies
Published: 2/24/2009
Author: Sharon J. Kemmerer
Abstract: Started in 2005, the Manufacturing Interoperability Program has seen an investment of roughly 25-30 full-time staff who have researched, developed, and deployed standards, tools, techniques, and testing environments --- helping manufacturing enterpri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900184

38. An Evaluation of Description Logic for the Development of Product Models
Topic: Ontologies
Published: 11/10/2008
Authors: Xenia Fiorentini, Sudarsan Rachuri, Hyo Won Suh, Jae H. Lee, Ram D Sriram
Abstract: The languages and logical formalisms developed by information scientists and logicians concentrate on the theory of languages and logical theorem proving. These languages, when used by domain experts to represent their domain of discourse, most often ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900220

39. Ontology-based Technologies - Technology Transfer from Bioinformatics?
Topic: Ontologies
Published: 11/5/2008
Author: Fabian M. Neuhaus
Abstract: In the call for paper for OIC 2008 the description of the conference contains the following optimistic outlook: New approaches are required to enable greater flexibility, precision, timeliness and automation of analysis in response to rapidly evolvin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824728

40. An Ontology for Assembly Representation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7436
Topic: Ontologies
Published: 7/1/2007
Authors: Xenia Fiorentini, Iacopo Gambino, V.C. Liang, Sebti Foufou, Sudarsan Rachuri, Mahesh Mani, Conrad E Bock
Abstract: Mechanical assemblies are systems composed of modules that are either subassemblies or parts. Traditionally an assembly information model contains information regarding parts, their relationships, and its form. But it is important that the model also ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822740



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series