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Topic Area: Metrology
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Displaying records 831 to 840 of 850 records.
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831. Video-Based Metrology
Topic: Metrology
Published: 1/1/2002
Authors: Theodore D Doiron, John Richard Stoup, Marilyn N. Abrams, Tsai Hong Hong
Abstract: Video cameras are increasingly used to make dimensional measurements. Many of these systems use interpolation of the pixel data, with some systems claiming to find edges with precision of l/100 of a pixel. We have studied the response of single pixel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821741

832. Video-Based Metrology
Topic: Metrology
Published: 1/1/2002
Authors: Theodore D Doiron, Marilyn N. Abrams, Tsai Hong Hong, Michael O Shneier
Abstract: With the rapid growth of video-based measurement and inspection systems, we would like to determine the extent to which industry needs calibration artifacts and standardized methods for video metrology. We hope to open a dialog among users for discus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822450

833. Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer
Topic: Metrology
Published: 7/1/2003
Authors: Thomas W LeBrun, Kevin W Lyons, Yong-Gu Lee
Abstract: In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822040

834. Virtual Surface Calibration Database
Topic: Metrology
Published: 1/1/2004
Authors: Thomas B Renegar, Theodore Vincent Vorburger, Son H. Bui
Abstract: This paper presents the development of a virtual surface calibration database for parameter evaluation and algorithm verification. The database runs from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, univers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822149

835. Virtual Surface Calibration and Computation Uncertainty
Topic: Metrology
Published: 1/1/2004
Author: Son H. Bui
Abstract: Not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823179

836. Virtual Surface Calibration and Computational Uncertainty
Topic: Metrology
Published: 10/1/2004
Authors: Son H. Bui, Theodore Vincent Vorburger, Thomas B Renegar
Abstract: This paper presents the development of a virtual surface calibration database for parameter evaluation and algorithm verification. The database runs from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, univers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823170

837. Visualization of Surface Figure Using Zernike Polynomials
Topic: Metrology
Published: 12/1/1995
Authors: Christopher J. Evans, R E. Parks, P Sullivan, John S Taylor
Abstract: Commercial software in modern interferometers used in optical testing frequently fit the wave-front or surface-figure error to Zernike polynomials; typically 37 coefficients are provided. We provide visual representations of these data in a form that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820739

838. Voltage Modulation Scanned Probe Oxidation
Topic: Metrology
Published: 7/1/1999
Authors: F Perez-murano, K Birkelund, K Morimoto, John A. Dagata
Abstract: Scanned probe microscope (SPM) oxidation with voltage modulation leads to a significant enhancement of the oxide growth rate, improvement of the aspect ratio of oxide features, and control of the structural and electrical properties of the SPM oxide. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821776

839. Voltage Modulation Scanned Probe Oxidation (Abstract)
Topic: Metrology
Published: 1/1/1998
Authors: John A. Dagata, T Inoue, J Itoh, K Matsumoto, H Yokoyama
Abstract: This talk describes methods for enhancing the growth rate and electrical characteristics of nanostructures produced on silicon and titanium substrates by scanned probe microscope (SPM) oxidation. Direct oxidation of a substrate by the intense electr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823101

840. Wavelength-Shift Interferometry: Using a Dither to Improve Accuracy
Topic: Metrology
Published: 1/1/1996
Authors: Jack A Stone Jr, Alois Stejskal, Lowell P. Howard
Abstract: A dither in path length can dramatically improve the accuracy of wavelength-shift methods used for absolute distance interferometry. Here we report how a dither improves the accuracy of absolute distance measurement by two orders of magnitude, reduci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820825



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