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Topic Area: Metrology
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Displaying records 831 to 840 of 856 records.
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831. Using uncalibrated lasers as wavelength standards
Topic: Metrology
Published: 10/1/2008
Author: Jack A Stone Jr
Abstract: The fundamental atomic physics of a gas laser transition is such that the transition frequency, or equivalently, the vacuum wavelength of the laser, cannot vary from its central value by more than a few parts in 106. The uncertainty of the gas laser ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900948

832. Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing
Topic: Metrology
Published: 1/1/2005
Authors: Michael T Postek, Andras Vladar
Abstract: Instrumentation and metrology are integral to the emerging nanotechnology enterprise, and have been identified by the U. S. National Nanotechnology Initiative (NNI) as one of a number of critical nanotechnology areas. Instrumentation and metrology cr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822382

833. Variations in Size Measurements by Indicating Gaging Systems
Topic: Metrology
Published: 1/1/1994
Authors: Ralph C. Veale, A Strang, S Merrit, H Chou
Abstract: The National Institute of Standards and Technology has investigated the efficacy of indicating gaging systems used to measure pitch diameter and functional size of threaded fasteners. Three external systems and four internal systems, representing fou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820724

834. Verifying Measurement Uncertainty Using a Control Chart With Dynamic Control Limits
Topic: Metrology
Published: 9/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A control chart with dynamic control limit is proposed for promoting the developing process of an uncertainty budget, and verifying the developed measurement uncertainty. The up and low dynamic control limit, 2 sd, is calculated from the updated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823223

835. Verifying Measurement Uncertainty Using a Control Chart With Dynamic Control Limits
Topic: Metrology
Published: 1/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: We propose a control chart with dynamic control limits that promotes the process of developing and refining an uncertainty budget and verifying the measurement uncertainty. The upper and lower dynamic control limits, µ +2s and µ - 2s, are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824602

836. Vibration of a Room-Sized Airspring-Supported Slab
Topic: Metrology
Published: 1/1/1998
Authors: H Amick, B Sennewald, N C Pardue, E Clayton Teague, Brian R Scace
Abstract: This paper reports the results of the finite element analysis and in situ testing of a large-scale (4 m x 10 m) pneumatically isolated concrete slab. The slab was constructed as a design prototype for next-generation metrology laboratories at the Nat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820887

837. Video-Based Metrology
Topic: Metrology
Published: 1/1/2002
Authors: Theodore D Doiron, John Richard Stoup, Marilyn N. Abrams, Tsai Hong Hong
Abstract: Video cameras are increasingly used to make dimensional measurements. Many of these systems use interpolation of the pixel data, with some systems claiming to find edges with precision of l/100 of a pixel. We have studied the response of single pixel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821741

838. Video-Based Metrology
Topic: Metrology
Published: 1/1/2002
Authors: Theodore D Doiron, Marilyn N. Abrams, Tsai Hong Hong, Michael O Shneier
Abstract: With the rapid growth of video-based measurement and inspection systems, we would like to determine the extent to which industry needs calibration artifacts and standardized methods for video metrology. We hope to open a dialog among users for discus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822450

839. Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer
Topic: Metrology
Published: 7/1/2003
Authors: Thomas W LeBrun, Kevin W Lyons, Yong-Gu Lee
Abstract: In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822040

840. Virtual Surface Calibration Database
Topic: Metrology
Published: 1/1/2004
Authors: Thomas B Renegar, Theodore Vincent Vorburger, Son H. Bui
Abstract: This paper presents the development of a virtual surface calibration database for parameter evaluation and algorithm verification. The database runs from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, univers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822149



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