NIST logo

Publications Portal

You searched on:
Topic Area: Metrology

Displaying records 761 to 770 of 855 records.
Resort by: Date / Title


761. Microform Calibrations in Surface Metrology
Topic: Metrology
Published: 2/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the prof ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820769

762. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Topic: Metrology
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820754

763. User Manual for the Interim Testing Artifact for CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5602
Topic: Metrology
Published: 2/1/1995
Authors: Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
Abstract: The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820767

764. A Metrology Approach to Unifying Rockwell C Hardness Scales
Topic: Metrology
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820772

765. Acquisition and Analysis Software for an Enhanced Bandwidth Phase Measuring Interferometer
Topic: Metrology
Published: 1/1/1995
Author: P Sullivan
Abstract: The aim of the project is to investigate the potential of expanding the instrument measurement bandwidth of a traditional phase measurement interferometer (PMI) system using a comparatively simple optical / software modification. This would offer the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820776

766. Automated Calibration of Scanning Probe Microscopy by Image Processing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5668
Topic: Metrology
Published: 1/1/1995
Author: J Jorgensen
Abstract: The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820743

767. Automated Manufacturing Research Facility: 1994 Annual Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5613
Topic: Metrology
Published: 1/1/1995
Authors: David C Stieren, James S. Albus
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820774

768. Calibration Uncertainties for Microform of Rockwell Hardness Indenters
Topic: Metrology
Published: 1/1/1995
Authors: F Rudder, Jun-Feng Song
Abstract: A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform calibrations is to unify national and international comparisons of hardness tests. Using accepted ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820760

769. Computer Modeling of Heterodyne Interferometer Errors
Topic: Metrology
Published: 1/1/1995
Authors: Lowell P. Howard, Jack A Stone Jr
Abstract: A computer model and methodology for modeling optical mixing errors in heterodyne interferometers is presented. The model is based on the Jones calculus and uses a matrix formalism to eliminate simplifications and reduce assumptions in the model. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820741

770. Damage Processes in Ceramics Resulting from Diamond Tool Indentation and Scratching in Various Environments
Topic: Metrology
Published: 1/1/1995
Authors: A Ruff, H Shin, Christopher J. Evans
Abstract: Studies have been carried out to determine the influence of different chemical environments and tool shapes on damage produced during diamond tool scratching and indenting of two advanced ceramics: chemical-vapor-deposited silicon carbide and a compo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820761



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series