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Topic Area: Metrology

Displaying records 761 to 770 of 850 records.
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761. Automated Calibration of Scanning Probe Microscopy by Image Processing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5668
Topic: Metrology
Published: 1/1/1995
Author: J Jorgensen
Abstract: The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820743

762. Automated Manufacturing Research Facility: 1994 Annual Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5613
Topic: Metrology
Published: 1/1/1995
Authors: David C Stieren, James S. Dr. Albus
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820774

763. Calibration Uncertainties for Microform of Rockwell Hardness Indenters
Topic: Metrology
Published: 1/1/1995
Authors: F Rudder, Jun-Feng Song
Abstract: A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform calibrations is to unify national and international comparisons of hardness tests. Using accepted ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820760

764. Computer Modeling of Heterodyne Interferometer Errors
Topic: Metrology
Published: 1/1/1995
Authors: Lowell P. Howard, Jack A Stone Jr
Abstract: A computer model and methodology for modeling optical mixing errors in heterodyne interferometers is presented. The model is based on the Jones calculus and uses a matrix formalism to eliminate simplifications and reduce assumptions in the model. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820741

765. Damage Processes in Ceramics Resulting from Diamond Tool Indentation and Scratching in Various Environments
Topic: Metrology
Published: 1/1/1995
Authors: A Ruff, H Shin, Christopher J. Evans
Abstract: Studies have been carried out to determine the influence of different chemical environments and tool shapes on damage produced during diamond tool scratching and indenting of two advanced ceramics: chemical-vapor-deposited silicon carbide and a compo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820761

766. Design, Specification and Tolerancing of Micrometer - Tolerance Assembles
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5615
Topic: Metrology
Published: 1/1/1995
Author: Dennis A Swyt
Abstract: As increasing number of economically important products manufactured by U.S. companies are comprised of assemblies of macroscopic parts with microscopic tolerances, that is, parts from a few to hundreds of millimeters in size where the acceptable dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820779

767. Development of Rockwell Hardness Standards: From Performance Comparisons to Fundamental Metrology
Topic: Metrology
Published: 1/1/1995
Authors: J Smith, Jun-Feng Song, F Rudder, Theodore Vincent Vorburger
Abstract: Based on the Rockwell diamond indenter's microform calibrations recently developed at NIST, as well as a deadweight standardized Rockwell hardness machine, the NIST Rockwell hardness standard calibration has been established. Our approach makes i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820768

768. Device Fabrication by Scanned Probe Oxidation
Topic: Metrology
Published: 1/1/1995
Author: John A. Dagata
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820729

769. Enhanced Machinability of Silicon Carbide via Microstructural Design
Topic: Metrology
Published: 1/1/1995
Authors: Nitin P Padture, Christopher J. Evans, Hockin D. Xu, Brian Ronald Lawn
Abstract: The machinability of a heterogeneous silicon carbide with weak interphase boundaries, elongated grains, and high internal stresses is evaluated relative to a homogeneous control material with a well-bonded, equiaxed, and unstressed grain structure. D ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820752

770. Error Compensation for CMM Touch Trigger Probes
Topic: Metrology
Published: 1/1/1995
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, Christoph Johann Witzgall, M Levenson, et al
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modem coordinate measuring machines (CMMs). The model provides a quantitative description of the pre-travel variation or probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820736



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