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Topic Area: Lean Manufacturing
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1. Toward the Ideal of Automating Production Optimization
Topic: Lean Manufacturing
Published: 11/15/2013
Authors: John L Michaloski, Frederick M Proctor, Jorge Arinez, Jonatan Berglund
Abstract: The advent of improved factory data collection offers a prime opportunity to continuously study and optimize factory operations. Although manufacturing optimization tools can be considered mainstream technology, most U.S. manufacturers do not take fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914707

2. A Roadmap for STEP-NC Enabled Interoperable Manufacturing
Topic: Lean Manufacturing
Published: 6/17/2011
Authors: Fiona Zhao, Frederick M Proctor, Martin Hardwick, Sid Venkatesh, David Odendahl, Xun Xu
Abstract: STEP-NC is the result of a ten-year international effort to replace the RS274D (ISO 6983) G and M code standard with a modern associative language. The new standard connects CAD design data to CAM process data so that smart applications can understan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908419

3. National Workshop on Challenges to Innovation in Advanced Manufacturing: Industry Drivers and R&D Needs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7723
Topic: Lean Manufacturing
Published: 9/30/2010
Author: John A Slotwinski
Abstract: Representatives from manufacturers, academic research laboratories, the federal government and other organizations met on November 3rd and 4th, 2009 in Gaithersburg, Maryland to discuss the drivers that are encouraging companies and industries to int ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906378

4. Modal Parameter Identification from Output-only Measurement Data: Application to Operating Spindle Condition Monitoring
Topic: Lean Manufacturing
Published: 9/23/2008
Authors: Ruqiang Yan, Robert Gao, Zhang Li, Kang B Lee
Abstract: This paper presents an experimental investigation of the dynamics of a custom-designed spindle test system under different operation conditions and at various stages of its service life. Unlike classical modal analysis techniques where known input ex ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824684



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