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Topic Area: Conformance Testing
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Displaying records 11 to 20 of 147 records.
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11. An IEEE 1588 Performance Testing Dashboard for Power Industry Requirements
Topic: Conformance Testing
Published: 9/12/2011
Authors: Julien Marc Amelot, YaShian Li-Baboud, Clement Vasseur, Jeffrey Fletcher, Dhananjay Anand, James Moyne
Abstract: The numerous time synchronization performance requirements in the Smart Grid entails the need for a set of common metrics and test methods to verify the ability of the network system and its components to meet the power industry‰s accuracy, reliabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909255

12. An IEEE 1588 Time Synchronization Testbed for Assessing Power Distribution Requirements
Topic: Conformance Testing
Published: 10/25/2010
Authors: Julien Marc Amelot, Clement Vasseur, Jeffrey Fletcher, Dhananjay Anand, YaShian Li-Baboud, James Moyne
Abstract: Wide-area monitoring applications for power distribution rely on accurate global time synchronization. Furthermore, there is interest in replacing current time synchronization methods such as IRIG, with distributed time synchronization protocols that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906259

13. An Intercomparison of AC Voltage Using a Digitally Synthesized Source
Topic: Conformance Testing
Published: 2/1/1990
Authors: Nile M. Oldham, W. F. Bruce, Chih-chiang Fu, A. G. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20277

14. An Overview of the Common Criteria Evaluation and Validation Scheme
Series: ITL Bulletin
Topic: Conformance Testing
Published: 10/1/2000
Author: Patricia R Toth
Abstract: This ITL Bulletin describes the Common Criteria Evaluation and Validation Sceheme.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151220

15. Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction
Topic: Conformance Testing
Published: 5/1/2000
Authors: X. Han, Gerard Nordeen Stenbakken, F. J. Von Zuben, Hans Engler
Abstract: This paper explores the neural network approach for empirical nonlinear error modeling. For systems that have a significant amount of nonlinearity, nonlinear error models require fewer parameters compared to linear models and require fewer test point ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7751

16. Application of the NIST Testing Strategies to a Multirange Instrument
Topic: Conformance Testing
Published: 6/1/1994
Authors: Andrew David Koffman, T. Michael Souders
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24405

17. Assessment of Proposed Calibration Support for the Analog Instrumentation Functions in the Integrated Family of Test Equipment (IFTE) Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4955
Topic: Conformance Testing
Published: 11/1/1992
Authors: Barry A. Bell, Nile M. Oldham, P. S. Hetrick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=667

18. Audio-Frequency Analysis of Inductive Voltage Dividers Based on Structural Models
Topic: Conformance Testing
Published: 7/1/1994
Authors: S. Avramov, Nile M. Oldham, Andrew David Koffman, R W Gammon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25630

19. Automatic Calibration of Inductive Voltage Dividers for the NASA Zeno Experiment
Topic: Conformance Testing
Published: 9/1/1993
Authors: S. Avramov, Nile M. Oldham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25144

20. Automatic Inductive Voltage Divider Bridge for Operation from 10 Hz to 100 kHz
Topic: Conformance Testing
Published: 6/1/1992
Authors: S. Avramov, Nile M. Oldham, Dean G Jarrett, Bryan C Waltrip
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10088



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