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Displaying records 21 to 24.
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21. Terahertz Mobility Measurements on P3HT Films: Device Comparison, Molecular Weight and Film Processing Effects
Topic: Optoelectronics
Published: Date unknown
Authors: Okan Esenturk, Joseph S Melinger
Abstract: We report the first direct comparison of relative carrier mobilities in semiconducting organic polymer films measured using non-contact optical pump terahertz probe spectroscopy to those reported in electrical device studies. Relative transient sign ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841108

22. The effect of growth orientation and diameter on the elasticity of GaN Nanowires - a combined insitu TEM and atomistic modeling investigation
Topic: Optoelectronics
Published: 12/20/2010
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: We characterized the elastic properties of GaN nanowires grown along different crystallographic orientations. In situ transmission electron microscopy tensile tests were conducted using a MEMS-based nanoscale testing system. Complementary atomistic s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906878

23. Transfer function analysis of measured transfer matrices
Topic: Optoelectronics
Published: 8/1/1989
Authors: Shao Yang, Igor Vayshenker, A. R. Mickelson
Abstract: Measurements of mode transfer matrices of various multimode fiber optic connectors are presented. To analyze the accuracy and repeatability of such measurements, a theoretical framework which employs mode transmission functions is derived. It is sho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912635

24. Waveform metrology and a quantitative study of regularized deconvolution
Topic: Optoelectronics
Published: 5/1/2010
Authors: Paul D Hale, Andrew M Dienstfrey
Abstract: We present methodology and preliminary results of a Monte-Carlo simulation to perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the behavior of different regularized inversion methods wi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904937



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