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31. Waveform metrology and a quantitative study of regularized deconvolution
Topic: Optoelectronics
Published: 5/1/2010
Authors: Paul D Hale, Andrew M Dienstfrey
Abstract: We present methodology and preliminary results of a Monte-Carlo simulation to perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the behavior of different regularized inversion methods wi ...

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