NIST logo

Publications Portal

You searched on:
Topic Area: Optoelectronics
Sorted by: date

Displaying records 41 to 50 of 63 records.
Resort by: Date / Title


41. Reflective optical chopper used in NIST high-power laser measurements
Series: Journal of Research (NIST JRES)
Topic: Optoelectronics
Published: 11/1/2008
Authors: Xiaoyu X. Li, Thomas Scott, Christopher L Cromer, Joshua Aram Hadler
Abstract: For the past ten years, NIST has used high-reflectivity, optical choppers as beamsplitters and attenuators when calibrating the absolute responsivity and response linearity of detectors used with high-power CW lasers. The chopper-based technique has ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33004

42. Ultra-low-noise all-fiber photon pair source
Topic: Optoelectronics
Published: 8/21/2008
Authors: Shellee Dawn Dyer, Martin J Stevens, Burm Baek, Sae Woo Nam
Abstract: We demonstrate an all-fiber photon pair source with the highest coincidence-to-accidental ratio (CAR) reported to date in the fiber optic telecom C-band.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33011

43. Synchronization monitoring of I/Q data and pulse carving misalignment for a serial-type 80-Gb/s RZ-DQPSK transmitter through optical/RF clock tone measurement
Topic: Optoelectronics
Published: 8/4/2008
Authors: Jeffrey A Jargon, Xiaoxia Wu, Louis Christen, Scott Nuccio, Omer F. Yilmaz, Loukas Paraschis, Yannick K. Lize, Alan Willner
Abstract: We experimentally demonstrate a monitoring technique for determining misalignment between the in-phase/ quadrature (I/Q) data streams and between the data and pulse carving in an 80 Gb/s serial-type return-to-zero differential quadrature phase-shift- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33136

44. Long distance optical frequency transfer over fiber: predicting the frequency stability from the fiber noise
Topic: Optoelectronics
Published: 5/18/2008
Authors: Nathan Reynolds Newbury, Paul A Williams, William C Swann
Abstract: We have recently demonstrated the coherent transfer of an optical signal over a 251 km link of optical fiber by use of the standard Doppler-cancellation approach to remove the effects of the fiber-link noise. The fundamental limit to the frequency in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32932

45. Absorption, transmission, and scattering of expanded polystyrene at millimeter-wave and terahertz frequencies
Topic: Optoelectronics
Published: 3/17/2008
Authors: Charles Dietlein, Jon E. Bjarnason, Erich N Grossman, Zoya Popovic
Abstract: Conventional material measurements of transmission and reflection in the millimeter-wave and terahertz frequency range do not differentiate between scattering and absorption, grouping effects from both mechanisms together into 'loss'. Accurate knowle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32981

46. Analyzing quantitative light scattering spectra of phantoms measured with optical coherence tomography
Topic: Optoelectronics
Published: 3/1/2008
Authors: Tasshi Dennis, Shellee Dawn Dyer, Andrew Dienstfrey, Gurpreet Singh, Paul Rice
Abstract: We demonstrate the ability of multiple forms of optical coherence tomography (OCT) in the frequency domain to quantitatively size scatterers. Combined with a variety of distinct phantoms, we gain insight into the measurement uncertainties associated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32640

47. Photoconductive lifetimes of carbon nanotubes films
Topic: Optoelectronics
Published: 11/29/2007
Authors: Katie Hurst, Richard K. Ahrenkiel, Steve W. Johnston, Anne Dillon, Lara Roberson, John H Lehman
Abstract: The photoconductive recombination lifetimes of carbon nanotube (CNT) thin films as a function of wavelength are measured by resonant-coupled photoconductive decay (RCPCD) method (1). The carrier recombination lifetime is a fundamental property of car ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32818

48. Photon-number discrimination using a semiconductor quantum dot, optically gated, field-effect transistor
Topic: Optoelectronics
Published: 9/7/2007
Authors: Eric Gansen, Mary A. Rowe, M. Greene, Danna Rosenberg, Todd E Harvey, Mark Su, Sae Woo Nam, Richard P Mirin
Abstract: Detectors capable of resolving the number of photons in a pulse of light are important components for the advancement of quantum information technologies. We demonstrate photon-number discrimination using a novel single-photon detector that utilizes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32772

49. Round-robin testing of carbon nanotubes using Novel and traditional nanometrology tools
Topic: Optoelectronics
Published: 8/26/2007
Authors: John H Lehman, Tom Campbell, Anne Dillon, Roop Mahajan
Abstract: Quantitative, systematic and reproducible metrology of carbon nanotubes is paramount to the fundamental understanding of these promising nanomaterials. Moreover, development of novel techniques which extend the current arsenal of nanotools is also de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32604

50. Absolute Absorptivity of Single-walled Carbon Nanotubes Employing a Pyroelectric Detector
Topic: Optoelectronics
Published: 12/20/2006
Authors: Katie Hurst, Anne Dillon, John H Lehman
Abstract: Optical properties are important for determining fundamental characteristics of carbon single-walled nanotube (SWNT) samples including purity, chirality, and tube diameter. Previously, we have estimated the volume fraction of metallic versus semicond ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32551



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series