Publications Portal

You searched on:
Topic Area: Optoelectronics

Displaying records 41 to 50 of 60 records.
Resort by: Date / Title


41. Long distance optical frequency transfer over fiber: predicting the frequency stability from the fiber noise
Topic: Optoelectronics
Published: 5/18/2008
Authors: Nathan Reynolds Newbury, Paul A Williams, William C Swann
Abstract: We have recently demonstrated the coherent transfer of an optical signal over a 251 km link of optical fiber by use of the standard Doppler-cancellation approach to remove the effects of the fiber-link noise. The fundamental limit to the frequency in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32932

42. Absorption, transmission, and scattering of expanded polystyrene at millimeter-wave and terahertz frequencies
Topic: Optoelectronics
Published: 3/17/2008
Authors: Charles Dietlein, Jon E. Bjarnason, Erich N Grossman, Zoya Popovic
Abstract: Conventional material measurements of transmission and reflection in the millimeter-wave and terahertz frequency range do not differentiate between scattering and absorption, grouping effects from both mechanisms together into 'loss'. Accurate knowle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32981

43. Analyzing quantitative light scattering spectra of phantoms measured with optical coherence tomography
Topic: Optoelectronics
Published: 3/1/2008
Authors: Tasshi Dennis, Shellee Dawn Dyer, Andrew Dienstfrey, Gurpreet Singh, Paul Rice
Abstract: We demonstrate the ability of multiple forms of optical coherence tomography (OCT) in the frequency domain to quantitatively size scatterers. Combined with a variety of distinct phantoms, we gain insight into the measurement uncertainties associated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32640

44. Photoconductive lifetimes of carbon nanotubes films
Topic: Optoelectronics
Published: 11/29/2007
Authors: Katie Hurst, Richard K. Ahrenkiel, Steve W. Johnston, Anne Dillon, Lara Roberson, John H Lehman
Abstract: The photoconductive recombination lifetimes of carbon nanotube (CNT) thin films as a function of wavelength are measured by resonant-coupled photoconductive decay (RCPCD) method (1). The carrier recombination lifetime is a fundamental property of car ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32818

45. Photon-number discrimination using a semiconductor quantum dot, optically gated, field-effect transistor
Topic: Optoelectronics
Published: 9/7/2007
Authors: Eric Gansen, Mary A. Rowe, M. Greene, Danna Rosenberg, Todd E Harvey, Mark Su, Sae Woo Nam, Richard P Mirin
Abstract: Detectors capable of resolving the number of photons in a pulse of light are important components for the advancement of quantum information technologies. We demonstrate photon-number discrimination using a novel single-photon detector that utilizes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32772

46. Round-robin testing of carbon nanotubes using Novel and traditional nanometrology tools
Topic: Optoelectronics
Published: 8/26/2007
Authors: John H Lehman, Tom Campbell, Anne Dillon, Roop Mahajan
Abstract: Quantitative, systematic and reproducible metrology of carbon nanotubes is paramount to the fundamental understanding of these promising nanomaterials. Moreover, development of novel techniques which extend the current arsenal of nanotools is also de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32604

47. Absolute Absorptivity of Single-walled Carbon Nanotubes Employing a Pyroelectric Detector
Topic: Optoelectronics
Published: 12/20/2006
Authors: Katie Hurst, Anne Dillon, John H Lehman
Abstract: Optical properties are important for determining fundamental characteristics of carbon single-walled nanotube (SWNT) samples including purity, chirality, and tube diameter. Previously, we have estimated the volume fraction of metallic versus semicond ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32551

48. Quantum dot single photon sources studied with superconducting single photon detectors
Topic: Optoelectronics
Published: 11/1/2006
Authors: Martin J Stevens, Robert Hadfield, Robert E Schwall, Sae Woo Nam, Richard P Mirin
Abstract: We report the observation of photon antibunching from a single, self-assembled InGaAs quantum dot (QD) at temperatures up to 135 K. The second-order intensity correlation, g(2)(0), is less than 0.260 {+ or -} 0.024 for temperatures up to 100 K. At 12 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32237

49. Efficient Greens Function Modeling of Line and Surface Defects in Multilayered Anisotropic Elastic and Piezoelectric Material
Topic: Optoelectronics
Published: 10/2/2006
Authors: B. Yang, Vinod K Tewary
Abstract: Greens function (GF) modeling defects may take effect only if the GF as well as its various integrals over a line, a surface and/or a small volume can be efficiently evaluated. The GF itself is needed in modeling a point defect while the integrals ne ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851356

50. Improved Thermal Detector Coatings for Laser Radiometry at NIST
Topic: Optoelectronics
Published: 2/27/2006
Author: John H Lehman
Abstract: Nearly all of the radiometric standards for laser power and energy measurements at NIST and elsewhere in the world are based on thermal detectors. These detectors usually rely on a thermal absorber coating to enhance the detector responsivity. Ideall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32136



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series