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Topic Area: Microelectronics
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Displaying records 31 to 39.
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31. Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K
Topic: Microelectronics
Published: 3/1/2006
Authors: James Paul Randa, Eyal Gerecht, Dazhen Gu, Robert L Billinger
Abstract: We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32017

32. INTER-LABORATORY COMPARISON OF NOISE-PARAMETER MEASUREMENTS ON CMOS DEVICES WITH 0.12 um GATE LENGTH
Topic: Microelectronics
Published: 12/1/2005
Authors: James Paul Randa, Susan L. Sweeney, Tom McKay, David K Walker, David R. Greenberg, Jon Tao, Judah Mendez, G. Ali Rezvani, John J. Pekarik
Abstract: We present results of an interlaboratory comparison of S-parameter and noise-parameter measurements performed on 0.12 {mu}m gate-length CMOS transistors. Copies of the same device were measured at three different laboratories (IBM, NIST, RFMD), and t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32120

33. Checks of Amplifier Noise-Parameter Measurements
Topic: Microelectronics
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669

34. Noise Characterization of Multiport Amplifiers
Topic: Microelectronics
Published: 10/1/2001
Author: James Paul Randa
Abstract: I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5219

35. On-Wafer Measurements of Noise Temperature
Topic: Microelectronics
Published: 12/1/1999
Authors: James Paul Randa, Robert L Billinger, Joseph Paul Rice
Abstract: The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27649

36. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Microelectronics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L Billinger, Joseph Paul Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5598

37. Characterization of On-Wafer Diode Noise Sources
Topic: Microelectronics
Published: 6/1/1998
Authors: James Paul Randa, David K Walker, Lawrence P. Dunleavy, Robert L Billinger, Joseph Paul Rice
Abstract: A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27897

38. Noise Temperature Measurements on Wafer
Series: Technical Note (NIST TN)
Report Number: 1390
Topic: Microelectronics
Published: 3/1/1997
Author: James Paul Randa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11089

39. The Art in Science of microTAS (Editorial)
Topic: Microelectronics
Published: 3/12/0013
Author: Michael Gaitan
Abstract: The discovery of a natural phenomenon unveils a curtain of ignorance from what has always existed. However, the creation of art requires the use of materials and knowledge combined with artistic inspiration to create a work of aesthetic appeal. By ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913450



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