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1.
Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
Topic: Electromagnetics
Published: 6/1/2013
Authors: Chukwudi Azubuike Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S Obeng
Abstract: In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV da
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912850
2.
Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
Topic: Electromagnetics
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Yaw S Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
Abstract: In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrit
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913332
3.
NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications
Series: Handbook (NIST HB)
Report Number: 150-11
Topic: Electromagnetics
Published: 4/25/2013
Authors: Bethany E Hackett, Bradley W Moore, Dennis G Camell
Abstract: NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. I
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913586
4.
Estimating Uncertainties in Antenna Measurements
Topic: Electromagnetics
Published: 4/8/2013
Author: Michael H Francis
Abstract: We describe general methods of estimating uncertainties in antenna measurements. These include estimates based on theory (analysis1), simulation, and altering the measurement system (self-coparison tests). The important component sources of uncertain
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913006
5.
Evaluation of a Robotically Controlled Millimeter-Wave Near-Field Pattern Range at NIST
Determining mechaincal suitability for antenna measurements
Topic: Electromagnetics
Published: 4/8/2013
Authors: David R Novotny, Joshua A Gordon, Jason B Coder, Michael H Francis, Jeffrey R Guerrieri
Abstract: The Antenna Metrology Laboratory at the National Institute of Standards and Technology, USA (NIST) is developing a robotically controlled near-field pattern range for measuring antennas and components from 50 GHz to 500 GHz. This new range is intende
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913071
6.
A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"
Topic: Electromagnetics
Published: 12/1/2011
Authors: Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan Daniel Orloff, James C Booth, Juan Manuel O'C allaghan
Abstract: "This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the second and third-order harmonics and intermodulation products of several coplanar transmis
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907951
7.
Verification of Noise-Parameter Measurements and Uncertainties
Topic: Electromagnetics
Published: 11/1/2011
Authors: James Paul Randa, Dazhen Gu, David K Walker
Abstract: We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The ve
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904668
8.
On-Chip Security Using Electromagnetic Analysis
Series: Grant/Contract Reports (NISTGCR)
Report Number: 687-12-71
Topic: Electromagnetics
Published: 10/27/2011
Authors: James Schaffner, Dylan F Williams
Abstract: In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910062
9.
O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electromagnetics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932
10.
Electrical Characterization of Photoconductive GaN Nanowire Devices from 50 MHz to 33 GHz
Topic: Electromagnetics
Published: 7/1/2011
Authors: Thomas M Wallis, Dazhen Gu, Atif Imtiaz, Pavel Kabos, Paul Timothy Blanchard, Norman A Sanford, Kristine A Bertness, Christpher Smith
Abstract: The electrical response of two-port., photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of individual contacted nanowires showed an increase on the order of 10% throughout the measured frequency range after expo
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903093