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61. {I}In-Situ{/I} Torque Magnetometry: Magnetic Coupling in Fe/Cr/Fe Thin-Film Systems
Topic: Electromagnetics
Published: 10/31/2008
Authors: Dong-Hoon Min, S. B. Lee, John M Moreland
Abstract: We have developed an ultra-sensitive torque magnetometer tailored to the study of thin-film interface magnetism and interlayer magnetic exchange coupling. The magnetometer was composed of an optical-fiber interferometer and a customized silicon canti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32133

62. Characterization and Modeling or Random Vector-Network-Analyzer Measurement Errors
Topic: Electromagnetics
Published: 10/24/2008
Authors: Arkadiusz C. (Arkadiusz) Lewandowski, Dylan F Williams
Abstract: We present a technique for characterizing and modeling random vector-network-analyzer measurement errors. These errors manifest themselves as random changes or drift of vector-network-analyzer calibration coefficients. We model achange of calibrtion ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32950

63. Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 10/8/2008
Author: James R. Baker-Jarvis
Abstract: Many electromagnetic measurements are based on the relationship between dissipation and fluctuations. As measurement frequencies increase and dimensional scales decrease, an understanding of fluctuations and the effects of nonequilbrium behavior beco ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32734

64. Numerical Investigation of the Induced Voltage on a Cables Placed at Random Locations Inside a Metallic Enclosure
Topic: Electromagnetics
Published: 9/8/2008
Authors: Christopher L Holloway, Luis Nuno, Perry F. Wilson
Abstract: A very practical susceptibility problem has been analyzed in this paper. It consists of a cable of defined length and fixed terminals, but different layouts, placed in a metallic box with an aperture. The induced voltages for the different layouts ar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33031

65. Using Reverberation Chamber to Simulate the Power Delay Profile of a Wireless Environment
Topic: Electromagnetics
Published: 9/8/2008
Authors: Christopher L Holloway, E Genender, Catherine A Remley, John M Ladbury, Galen H Koepke, H Garbe
Abstract: Multipath propagation environment effects, such as frequency-selective fading, have a strong impact on the quality of the wireless channel. For example, multipath can impact bit error rate (BER) differently than Gaussian noise. For testing wireless ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33033

66. NIST Tests of the Wireless Environment in Automobile Manufacturing Facilities
Series: Technical Note (NIST TN)
Report Number: 1550
Topic: Electromagnetics
Published: 9/1/2008
Authors: Catherine A Remley, Galen H Koepke, Chriss A. Grosvenor, John M Ladbury, Dennis G Camell, Jason B Coder, Robert Johnk
Abstract: This report describes tests carried out by members of the NIST Electromagnetics Division to study the wireless environment in automotive manufacturing facilities. Testing was performed at three facilities during 2006 and 2007. We studied an assembly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33166

67. Electromagnetic Airframe Penetration Measurements of a Beechcraft Premier IA
Series: Technical Note (NIST TN)
Report Number: 1548
Topic: Electromagnetics
Published: 8/1/2008
Authors: Chriss A. Grosvenor, David R Novotny, Dennis G Camell, Galen H Koepke, Robert Johnk
Abstract: The National Institute of Standards and Technology has recently completed shielding effectiveness/penetration studies on three different aircraft types for the Federal Aviation Administration.  The studies are used to understand the cavity coupl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32982

68. Microwave Characterization of Semiconductors with a Split-Cylinder Cavity
Topic: Electromagnetics
Published: 8/1/2008
Authors: Billy F Riddle, James R. Baker-Jarvis, Michael D Janezic
Abstract: In this paper we demonstrate the use of a split-cylinder cavity for characterizing semiconductors over a temperature range of 173 K (-100oC) to 373 K (+100oC) at microwave frequencies (9-30 GHz). Complex permittivity measurements of silicon (Si) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32828

69. Chamber Imaging Using Spherical Near-Field Scanning
Topic: Electromagnetics
Published: 7/5/2008
Authors: Ronald Curtis Wittmann, Michael H Francis, Randy Direen
Abstract: We discuss recent measurements performed at the National Institute of Standards and Technology (NIST) that were used to characterize the incident fields within a test volume and to produce images of the test chamber.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32927

70. Near-field Scanning Measurements: Theory and practice
Topic: Electromagnetics
Published: 7/3/2008
Authors: Michael H Francis, Ronald Curtis Wittmann
Abstract: This chapter summarizes theoretical and practical aspects of near-field scanning methods. These methods allow complete characterization of the transmitting or receiving properties using measurements made in close proximity to an antenna.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32453



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