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Topic Area: Advanced Materials
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21.
Kinetic Inductance Contributions to the Nonlinear Response of Superconductors at Microwave Frequencies
Topic: Advanced Materials
Published: 7/11/2003
Authors: James C Booth, Kenneth Leong, Susan Schima
Abstract: We demonstrate how nonlinear effects in high temperature superconducting thin films can be quantified based on a current-dependent penetration depth {lambda}(J). Using an assumed form for {lambda}(J), we calculate the expected third-order harmonic si
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31363
22.
A Self-Attenuating Superconducting Transmission Line for Use as a Microwave Power Limiter
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, David A Rudman, Ronald H. Ono
Abstract: We have designed, fabricated, and tested a microwave power limiter based on high temperature superconductor thin film technology. The signal limiter takes the form of a 50 {Ohm} coplanar waveguide transmission line that is reversibly driven from the
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30581
23.
Description of the Nonlinear Behavior of Superconductors Using a Complex Conductivity
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, Susan Schima, Donald C. DeGroot
Abstract: The origin of the detrimental nonlinear response in the high Tc superconductor (HTS) microwave devices is currently not well understood. In order to help elucidate the origin of these nonlinear effects, we have performed phase-sensitive measurements
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30580
24.
Influence of Impedance Mismatch Effects on Measurements of Unloaded Q Factors of Transmission Mode Dielectric Resonators
Topic: Advanced Materials
Published: 6/1/2003
Authors: Kenneth Leong, James C Booth, Sang Yo Lee
Abstract: Precise measurements of the surface resistance of high temperature superconducting thin films using transmission mode dielectric resonators requires accurate knowledge of the unloaded Q factor. So far, the most accurate method of unloaded Q factor de
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30577
25.
Microwave Surface Impedance and Nonlinear Properties of MgB^d2^ Films
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, Sang Yo Lee, Kenneth Leong, J. H. Lee, J. Lim, H. N. Lee, S. H. Moon, B. Oh
Abstract: We have measured the temperature dependence of the microwave surface impedance and the nonlinear response of high-quality MgB^d2^ films on c-cut sapphire at temperatures below 40 K. MgB^d2^ films with surface resistance (Rs) as low as 0.09 m{Ohm} at
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30582
26.
Gaseous Electronics Conference RF Reference Cell Newsletter
Topic: Advanced Materials
Published: 5/3/1993
Author: James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32965
27.
Direct Measurement of Intrinsic Dirac Point and Fermi level at Graphene/Oxide interface and Its Band
Alignment by Cavity Enhanced Internal Photoemission
Topic: Advanced Materials
Published: 12/17/0012
Authors: Kun Xu, Caifu Zeng, Qin Zhang, Rusen Yan, Peide Ye, Kang Wang, Alan C. Seabaugh, Huili G. Xing, John S Suehle, Curt A Richter, David J Gundlach, Nhan V Nguyen
Abstract: We report the first direct measurement of the Dirac point, the Fermi level, and the work function of
graphene by performing internal photoemission measurements on a graphene/SiO2/Si structure with a
unique optical-cavity enhanced test structure.
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912242