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Topic Area: Advanced Materials
Displaying records 31 to 31.
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31. Direct Measurement of Intrinsic Dirac Point and Fermi level at Graphene/Oxide interface and Its Band
Alignment by Cavity Enhanced Internal Photoemission
Kun Xu, Caifu Zeng, Qin Q. Zhang, Rusen Yan, Peide Ye, Kang Wang, Alan C. Seabaugh, Huili G. Xing, John S Suehle, Curt A Richter, David J Gundlach, Nhan V Nguyen
We report the first direct measurement of the Dirac point, the Fermi level, and the work function of
graphene by performing internal photoemission measurements on a graphene/SiO2/Si structure with a
unique optical-cavity enhanced test structure. ...