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Topic Area: Advanced Materials

Displaying records 21 to 30 of 31 records.
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21. Interface Barrier Determination by Internal Photoemission: Applications to Metal/Oxide/Semiconductor Structure
Topic: Advanced Materials
Published: 5/23/2008
Author: Nhan V Nguyen
Abstract: Internal photoemission (IPE) spectroscopy is a powerful technique for investigating electronic properties at solid-solid interfaces.  Upon photon excitation, electrons or/and holes in the solid under an external electrical bias, accumulate at th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32964

22. Constraint Effect in Deformation of Copper Interconnect Lines Subjected to Cyclic Joule Heating
Topic: Advanced Materials
Published: 11/26/2007
Authors: David Thomas Read, Roy Howard Geiss, Nicholas Barbosa
Abstract: Using finite element analysis, we calculate the temperature range and the resulting cyclic Von Mises strain resulting from Joule heating, generated by the application of alternating current, applied to specimens representative of commercial copper da ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901599

23. Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry
Topic: Advanced Materials
Published: 11/1/2006
Authors: David G Seiler, John S Suehle
Abstract: This special article in Semiconductor International discusses NIST's role in metrology for the semiconductor industry as it moves to the nanoscale regime.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32487

24. A Superconducting Microwave Power Limiter for Protection of High-Performance Superconducting Electronics
Topic: Advanced Materials
Published: 7/11/2003
Authors: James C Booth, Kenneth Leong, Susan Schima
Abstract: We report on the development of a microwave power limiter based on high temperature superconductor technology. The power limiter takes the form of a 50 Ω coplanar waveguide transmission line that can be reversibly driven into the normal state as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31362

25. Kinetic Inductance Contributions to the Nonlinear Response of Superconductors at Microwave Frequencies
Topic: Advanced Materials
Published: 7/11/2003
Authors: James C Booth, Kenneth Leong, Susan Schima
Abstract: We demonstrate how nonlinear effects in high temperature superconducting thin films can be quantified based on a current-dependent penetration depth {lambda}(J). Using an assumed form for {lambda}(J), we calculate the expected third-order harmonic si ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31363

26. A Self-Attenuating Superconducting Transmission Line for Use as a Microwave Power Limiter
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, David A Rudman, Ronald H. Ono
Abstract: We have designed, fabricated, and tested a microwave power limiter based on high temperature superconductor thin film technology. The signal limiter takes the form of a 50 {Ohm} coplanar waveguide transmission line that is reversibly driven from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30581

27. Description of the Nonlinear Behavior of Superconductors Using a Complex Conductivity
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, Susan Schima, Donald C. DeGroot
Abstract: The origin of the detrimental nonlinear response in the high Tc superconductor (HTS) microwave devices is currently not well understood. In order to help elucidate the origin of these nonlinear effects, we have performed phase-sensitive measurements ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30580

28. Influence of Impedance Mismatch Effects on Measurements of Unloaded Q Factors of Transmission Mode Dielectric Resonators
Topic: Advanced Materials
Published: 6/1/2003
Authors: Kenneth Leong, James C Booth, Sang Yo Lee
Abstract: Precise measurements of the surface resistance of high temperature superconducting thin films using transmission mode dielectric resonators requires accurate knowledge of the unloaded Q factor. So far, the most accurate method of unloaded Q factor de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30577

29. Microwave Surface Impedance and Nonlinear Properties of MgB^d2^ Films
Topic: Advanced Materials
Published: 6/1/2003
Authors: James C Booth, Sang Yo Lee, Kenneth Leong, J. H. Lee, J. Lim, H. N. Lee, S. H. Moon, B. Oh
Abstract: We have measured the temperature dependence of the microwave surface impedance and the nonlinear response of high-quality MgB^d2^ films on c-cut sapphire at temperatures below 40 K. MgB^d2^ films with surface resistance (Rs) as low as 0.09 m{Ohm} at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30582

30. Gaseous Electronics Conference RF Reference Cell Newsletter
Topic: Advanced Materials
Published: 5/3/1993
Author: James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32965



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