NIST logo

Publications Portal

You searched on:
Topic Area: Standard Reference Data
Sorted by: title

Displaying records 1 to 10 of 19 records.
Resort by: Date / Title


1. Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis
Topic: Standard Reference Data
Published: 9/1/2003
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831299

2. Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
Topic: Standard Reference Data
Published: 8/1/2002
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Initial heterogeneity testing with the electron microprobe using WDS of three SiGe wafers cut from single-crystal boules of different concentrations (nominally 3.5, 6.5, and 14 atomic % Ge) is described. Random and repeat samplings over the entire s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831283

3. Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O-^d3^ Thick Films
Topic: Standard Reference Data
Published: 2/1/2003
Authors: S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Abstract: Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al^d2^O^d3^ substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831261

4. Demonstrating the Comparability of Certified Reference Materials
Topic: Standard Reference Data
Published: 7/24/2009
Authors: David Lee Duewer, Katrice A Lippa, Stephen E Long, Karen E Murphy, Katherine E Sharpless, Lorna Tregoning Sniegoski, Michael James Welch
Abstract: Certified Reference Materials (CRMs) enable the meaningful comparison of measurement results over time and place. When CRMs are used to calibrate or verify the performance of a measurement system, results produced by that system can be related throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901468

5. Evaluation of a Lead Lanthanum Zirconium Titanate (PLZT) Specimen for use as an Electron Microprobe Reference Material
Topic: Standard Reference Data
Published: 8/1/2001
Authors: Ryna B. Marinenko, Z Samardzija, S Bernik, M Kosec, M Ceh
Abstract: A Lead lanthanum zirconium titanate (PLZT) spec imen was studiedwith the wavelength dispersive electron probe microanalysis (EPMA) todetermine the composition and the extent of microheterogeneity of thematerial. Quantitative analysis of the specimen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831223

6. International Data Series, Cumulative Indexes 1973-2005
Series: Natl Std. Ref. Data Series (NIST NSRDS)
Report Number: 76-2005-1
Topic: Standard Reference Data
Published: 12/30/2005
Authors: James C. Rainwater, Michael Frenkel
Abstract: Cumulative Indexes include Compound-Formula-Name and System-Property Indexes for the period 1973-2005
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50253

7. NIST 101. Computational Chemistry Comparison and Benchmark Database
Topic: Standard Reference Data
Published: 11/1/1999
Author: Russell D Johnson III
Abstract: The CCCBDB is a collection of experimental and theoretical thermochemical properties for 580 neutral gas-phase species. The goal of the database/website is to provide a benchmark set of molecules and reactions for the evaluation of ab initio computat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831580

8. NIST Data Resources for X-Ray Photoelectron Spectroscopy
Topic: Standard Reference Data
Published: 10/1/2000
Author: Cedric John Powell
Abstract: A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831158

9. NIST Standard Reference Database 23: NIST Thermodynamic and Transport Properties of Refrigerants and Refrigerant Mixtures-REFPROP, Version 6.0
Series: Natl Std. Ref. Data Series (NIST NSRDS)
Topic: Standard Reference Data
Published: 9/1/1998
Authors: Mark O McLinden, S. A. Klein, Eric W Lemmon, Adele P Peskin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903930

10. NIST Standard Reference Database 23: Reference Fluid Thermodynamic and Transport Properties-REFPROP, Version 9.1
Series: Natl Std. Ref. Data Series (NIST NSRDS)
Topic: Standard Reference Data
Published: 5/7/2013
Authors: Eric W Lemmon, Marcia L Huber, Mark O McLinden
Abstract: This is a new release of the NIST Standard Reference Database 23, commonly known as REFPROP. Enhancements have been made to most areas of the NIST REFPROP program, including the graphical interface, the Excel spreadsheet, the FORTRAN files (i.e., cor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912382



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series