Publications Portal

You searched on:
Topic Area: Spectroscopy
Sorted by: title

Displaying records 1 to 10 of 101 records.
Resort by: Date / Title

1. Adsorption of Phosphate Anions on Gold Electrodes Modified by Underpotentially Deposited Silver Adatoms: Surface-Enhanced Raman Spectroscopy Study
Topic: Spectroscopy
Published: 5/4/1997
Authors: G Niaura, Adolfas Kastytis Gaigalas, V L. Vilker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100254

2. Application of Histograms in Evaluation of Large Collections of Gas Chromatographic Retention Indices
Topic: Spectroscopy
Published: 9/18/2009
Authors: Zenkevich G. Igor, Valeri Ivan Babushok, Peter J Linstrom, Edward White, Stephen E Stein
Abstract: The effective use of gas chromatographic retention data presented in the form of reten¬tion indices (RI) requires the development of a compre¬hensive structure-based digital archive of retention parameters. Development of such an archive includes the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902129

3. Articles- Correlation of the Raman Spectra with the Thermal Conductivity of a Set of CVD Diamond Wefers
Topic: Spectroscopy
Published: 1/1/2001
Authors: E S. Etz, A Feldman, Wilbur S. Hurst
Abstract: Reported are the results of a Raman spectroscopic study of a set of chemical-vapor-deposited (CVD) diamond wafers of known thermal conductivity (k). The spectra are obtained at laser wavelengths 514.5, 785 and 1064 nm. The Raman features of these spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831166

4. Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy
Topic: Spectroscopy
Published: 9/1/2000
Authors: Chris A Michaels, C EJ Dentinger, Lee J Richter, D B Chase, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface en ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831194

5. Broadband, frequency comb spectroscopy
Topic: Spectroscopy
Published: 5/4/2008
Authors: Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: A stabilized frequency comb provides a broadband array of highly resolved comb lines. Using a multiheterodyne technique, we measure the amplitude and phase of every comb line, allowing for massively parallel, high-resolution spectroscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32960

6. Capacitive readout technique for studies of dissipation in GaN nanowire mechanical resonators
Topic: Spectroscopy
Published: Date unknown
Authors: Kristine A Bertness, Joshua R. Montague, Norman A Sanford, Victor Bright, C. T. Rogers
Abstract: A variable-temperature, homodyne reflectometry measurement technique for detecting nanoscale mechanical motion has recently been developed. We have extended this technique to make the first all-electrical measurements of an ensemble of as-grown, c-a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908641

7. Challenges and Opportunities of Organic Electronics
Topic: Spectroscopy
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

8. Characterization of 3-Color CARS in a 2-Pulse Broadband CARS Spectrum
Topic: Spectroscopy
Published: 11/15/2007
Authors: Young Jong Lee, Marcus T Cicerone, Yuexin Liu
Abstract: We present a new and simple approach to broadband coherent anti-Stokes Raman scattering (CARS) microscopy that yields background-free vibrational spectra. We present evidence for a mechanism where two different frequency components in a continuum pul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852761

9. Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy
Topic: Spectroscopy
Published: 1/1/2001
Authors: E Landree, Terrence J Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C Diebold
Abstract: To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material standards are needed for validating real-time diagnostic techniques used during production. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831214

10. Characterization of Standard Reference Material 2940, Mn-Ion-Doped Glass, Spectral Correction Standard for Fluorescence
Topic: Spectroscopy
Published: 4/1/2009
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Douglas H. Blackburn, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2940 is a cuvette-shaped, Mn-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance validation of steady-state fluorescence spectrometers. Properties of this stan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832237