NIST logo

Publications Portal

You searched on: Topic Area: Spectroscopy Sorted by: date

Displaying records 21 to 30 of 84 records.
Resort by: Date / Title

21. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Spectroscopy
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter

22. Frequency-stabilized cavity ring-down spectroscopy measurements of carbon dioxide isotope ratios
Topic: Spectroscopy
Published: 5/15/2011
Authors: Joseph Terence Hodges, David A Long, Mitchio Okumura, Charles E Miller
Abstract: Carbon dioxide (CO2) isotopic ratios were measured at 1.6 μm through the use of frequency-stabilized cavity ring-down spectroscopy (FS-CRDS). We report the highest spectrum signal-to-noise ratios to date for CO2 transitions, with values as high ...

23. Conformer-specific vibronic spectroscopy and vibronic coupling in a flexible bichromophore: bis-(4-hydroxyphenyl)methane
Topic: Spectroscopy
Published: 4/28/2011
Authors: Chirantha P. Rodrigo, Christian Muller, Nathan Pillsbury, William H. James III, David F Plusquellic, Timothy Zwier
Abstract: The vibronic spectroscopy of jet-cooled bis-(4-hydroxyphenyl)methane (b4HPM) has been explored using fluorescence excitation (FE), dispersed fluorescence (DFL), UV-UV holeburning (UVHB), UV depletion (UVD), and fluorescence-dip infrared (FDIR) spectr ...

24. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Spectroscopy
Published: 4/8/2011
Author: Christina Ann Hacker

25. Reliability of Ion Mobility Spectrometry for Qualitative Analysis of Complex, Multicomponent Illicit Drug Samples
Topic: Spectroscopy
Published: 3/20/2011
Authors: Jennifer R Verkouteren, Jessica L Staymates
Abstract: Ion Mobility Spectrometry (IMS) has been used for trace analysis of illicit drugs, but it can also provide reliable qualitative analysis of bulk forensic drug items, despite the complexity of these samples. The drug/drug and drug/excipient combinati ...

26. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Topic: Spectroscopy
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter

27. Thermochemistry of Ammonium Nitrate, NH4NO3, in the Gas Phase
Topic: Spectroscopy
Published: 10/7/2010
Author: Karl K Irikura
Abstract: Hildenbrand and coworkers have shown recently that the vapor above solid ammonium nitrate includes molecules of NH4NO3, not only NH3 and HNO3 as previously believed. Their measurements led to thermochemical values that imply an enthalpy change of D2 ...

28. Standard Photoacoustic Spectrometer: Model and Validation using O2 A-Band Spectra
Topic: Spectroscopy
Published: 6/30/2010
Authors: Keith A Gillis, Daniel K. Havey, Joseph Terence Hodges
Abstract: We model and measure the absolute response of an intensity-modulated photoacoustic spectrometer comprising a 10 cm long resonator and having a {I}Q{/I}-factor of approximately 30. We present a detailed theoretical analysis of the system and predict ...

29. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Spectroscopy
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker

30. Ultrafast Photoinduced Carrier Dynamics of Organic Semiconductors Measured by Time-Resolved Terahertz Spectroscopy
Topic: Spectroscopy
Published: 4/28/2010
Authors: Okan Esenturk, Joseph S Melinger, Paul A. Lane, Edwin J Heilweil
Abstract: Intrinsic properties of organic semiconductors are investigated by Time-Resolved Terahertz Spectroscopy (TRTS) to assess their relative mobilities and efficiencies. Our results are well correlated with device measurements, and show the effectiveness ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series