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Topic Area: Nanotechnology
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Displaying records 301 to 310 of 382 records.
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301. Shape Factors of ISO 12103-A3 (Medium Test Dust)
Topic: Nanotechnology
Published: 11/1/2000
Authors: Robert A Fletcher, David S. Bright
Abstract: A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical particle counters are used to test filtering efficiency. Particle shape plays a role in both fil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831146

302. Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
Topic: Nanotechnology
Published: 8/1/1999
Authors: P E Thompson, K D Hobart, M E Twigg, G Jernigan, T E Dillon, S L Rommel, P R Berger, David S Simons, P Chi, R Lake, A C Seabaugh
Abstract: Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831118

303. Silicon Carbide Nanostructures: A Tight Binding Approach
Topic: Nanotechnology
Published: 6/28/2009
Authors: Anthony D. Patrick, Xiao Dong, Thomas C Allison, Estela Blaisten-Barojas
Abstract: A tight-binding model Hamiltonian is newly parametrized for silicon carbide based on fits to a database of energy points calculated within the density functional theory approach of the electronic energy surfaces of nanoclusters and the total en ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904026

304. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Nanotechnology
Published: 4/8/2011
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908431

305. Simulation of lattice strain due to CNT-metal interface
Topic: Nanotechnology
Published: 1/17/2011
Authors: Alexander Y. Smolyanitsky, Vinod K Tewary
Abstract: We report an atomistic molecular statics study of strains in single wall carbon nanotubes (SWCNTs) interfaced with a planar nickel surface. We calculate axial and radial strain distributions along the SWCNT axis. We demonstrate strains of up to 2% ex ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906877

306. Simultaneous Multianalyte Detection with a Nanometer-Scale Pore
Topic: Nanotechnology
Published: 5/15/2001
Authors: John J Kasianowicz, S. E. Henrickson, H H. Weetall, B Robertson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903581

307. Single laser pulse effects on suspended-Au-nanoparticle size distributions and morphology
Topic: Nanotechnology
Published: 4/30/2013
Authors: Richard E Cavicchi, Douglas C Meier, Cary Presser, Suvajyoti S. Guha
Abstract: Samples of suspended gold nanoparticles in the diameter range 10 nm to 100 nm were subjected to a single 7 ns pulse from a 532 nm laser to determine the effects of laser power on particle size distribution, mean size, and morphology. The experime ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912928

308. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Nanotechnology
Published: 5/15/2014
Authors: Bonghwan Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

309. Single particle biophysics: Nanopores, liposomes and mitochondrial diseases
Topic: Nanotechnology
Published: 3/22/2010
Author: Joseph Earl Reiner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905288

310. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330



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