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Topic Area: Nanotechnology
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301. Synthetic Approach for Tunable, Size-Selective Formation of Monodisperse, Diphosphine-Protected Gold Nanoclusters
Topic: Nanotechnology
Published: 8/10/2010
Authors: John M. Pettibone, Jeffrey W Hudgens
Abstract: Most nanoparticle syntheses, including those based on the Brust-Schiffrin method, produce a mixture of different metal core sizes. This report presents a new strategy for controlling the size and dispersity of ultra-small nanoclusters through select ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905721

302. TSV Reveal height and bump dimension metrology by the TSOM method
Topic: Nanotechnology
Published: 4/30/2013
Authors: Ravikiran Attota, Haesung Park, Victor Vartanian, Ndubuisi George Orji, Richard A Allen
Abstract: Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913667

303. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

304. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

305. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831404

306. Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages
Topic: Nanotechnology
Published: 4/18/2010
Authors: J. J. Brown, A. I. Baca, Kristine A Bertness, D. A. Dikin, R. S. Ruoff, Victor M. Bright
Abstract: This paper reports the first direct tensile tests on nearly defect free, n-type (Si-doped) gallium nitride single crystal nanowires. Here, for the first time, nanowires have been integrated with actuated, active microelectromechanical (MEMS) structur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902539

307. The Cooper Pair Transistor
Topic: Nanotechnology
Published: 9/17/2010
Author: Jose Alberto Aumentado
Abstract: The Cooper pair transistor (CPT) is a superconducting electrometer that has applications in quantum information as well as fundamental superconductivity studies. Since it operates in a near-dissipationless mode, it has potential as a minimally inva ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902021

308. The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/1/1995
Authors: David S Simons, P Chi, Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100550

309. The Effect of Substrate Material on Silver Nanoparticle Antimicrobial Efficacy
Topic: Nanotechnology
Published: 12/1/2010
Authors: Benita Dair, Dave M. Saylor, T. Eric Cargal, Grace R. French, Kristen M. Kennedy, Rachel S. Casas, Jonathan E Guyer, James A Warren, Steven K. Pollack
Abstract: With the advent of Nanotechnology, silver nanoparticles increasingly are being used in coatings, especially in medical device applications, to capitalize on their antimicrobial properties. The increased antimicrobial efficacy of nanoparticulate silv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903174

310. The Effects of Humidity and Surface Free Energy on Adhesion Force between AFM Tip and a Silane Self-Assembled Monolayer Film
Topic: Nanotechnology
Published: 2/17/2010
Authors: Chien-Chao Huang, Lijiang Chen, , Xiaohong Gu, Minhua Zhao, Tinh Nguyen, Sanboh Lee
Abstract: The relationship between AFM probe-sample adhesion force and relative humidity (RH) at five different levels of surface free energy (γs) of an organic self-assembled monolayer (SAM) has been investigated. Different γs levels were achieved b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904627