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Topic Area: Nanotechnology

Displaying records 61 to 70 of 384 records.
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61. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Nanotechnology
Published: 4/10/2012
Authors: Ravikiran (Ravikiran) Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

62. On CD-AFM bias related to probe bending
Topic: Nanotechnology
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

63. Optical fiber-coupled cryogenic radiometer with carbon nanotube absorber
Topic: Nanotechnology
Published: 4/1/2012
Authors: David J Livigni, Nathan A Tomlin, Christopher L Cromer, John H Lehman
Abstract: A cryogenic radiometer was constructed for direct-substitution optical fiber power measurements. The cavity is intended to operate at the 3 K temperature stage of a dilution refrigerator or 4.2 K stage of a liquid cryostat. The optical fiber is remov ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909507

64. Modeling the effects of acid amplifiers on photoresist stochastics
Topic: Nanotechnology
Published: 3/23/2012
Authors: Gregg M. Gallatin, Patrick Naulleau, Robert Brainard
Abstract: The tradeoff between Resolution, Line Edge Roughness (LER) and Sensitivity, the so called RLS tradeoff, continues to be a difficult challenge, especially for EUV lithography. Acid amplifiers have recently been proposed as a method to improve upon t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910777

65. Tumor Necrosis Factor Interaction with Gold Nanoparticles
Topic: Nanotechnology
Published: 3/14/2012
Authors: De-Hao D. Tsai, Sherrie R. Elzey, Frank W DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael Russel Zachariah, Athena M Keene, Jeffrey D Clogston, Vincent A Hackley
Abstract: We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909899

66. Electrospray ‹ Differential Mobility Analysis as an Orthogonal Tool to Size Exclusion Chromatography for Characterization of Protein Aggregates
Topic: Nanotechnology
Published: 3/12/2012
Authors: Suvajyoti S. Guha, Joshua R. Wayment, Michael J Tarlov, Michael Russel Zachariah
Abstract: The biopharmaceutical industry characterizes and quantifies aggregation of protein therapeutics using multiple analytical techniques to cross validate results. Here we demonstrate the use of electrospray-differential mobility analysis (ES-DMA), a gas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909715

67. Fractional Diffusion, Low Exponent Levy Stable Laws, and Slow Motion Denoising of Helium Ion Microscope Nanoscale Imagery
Series: Journal of Research (NIST JRES)
Report Number: 117.006
Topic: Nanotechnology
Published: 2/22/2012
Authors: Andras Vladar, Alfred S Carasso
Abstract: Helium ion microscopes (HIM) are capable of acquiring images with better than 1nm resolution, and HIM images are particularly rich in morphological surface details. However, such images are generally quite noisy. A major challenge is to denoise the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906607

68. Characterizing Equilibrium in Epitaxial Growth
Topic: Nanotechnology
Published: 2/20/2012
Authors: Paul N. Patrone, Russel Caflisch, Dionisios Margetis
Abstract: Using a kinetic model of epitaxial growth, we describe how geometry controls kinetic pathways through which external deposition influences the state of a vicinal surface. The state of the surface is determined by three key, adjustable parameters: th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909660

69. Reaction Network Governing Diphosphine-Protected Gold Nanocluster Formation from Nascent Cationic Platforms
Topic: Nanotechnology
Published: 2/16/2012
Authors: John M Pettibone, Jeffrey W Hudgens
Abstract: We identify the reaction network governing gold monolayer protected cluster (MPC) formation during the reduction of Au(PPh^d3^)Cl and L^u5^ (L^u5^ = 1,5-bis(diphenylphosphino)pentane) in solutions. UV-vis spectroscopy and electrospray ionization mass ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909879

70. Quantitative Measurements of the Size Scaling of Linear and Circular DNA in Nanofluidic Slitlike Confinement
Topic: Nanotechnology
Published: 2/14/2012
Authors: Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio, Samuel M Stavis
Abstract: Quantitative size measurements of single linear and circular DNA molecules in nanofluidic slitlike confinement are reported. A novel experimental method using DNA entropophoresis down a nanofluidic staircase implemented comprehensive variation of sl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908052



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