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Topic Area: Nanotechnology

Displaying records 381 to 390 of 395 records.
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381. High Dynamic Range SIMS Depth Profiling on In Situ Ion-beam-generated Mesas Using the Ion Microscope
Topic: Nanotechnology
Published: 7/1/1992
Author: John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902082

382. Localization of Labeled Compounds in Human Hair Using SIMS
Topic: Nanotechnology
Published: 6/5/1992
Authors: John G Gillen, Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902150

383. Imaging with Bubble Detectors
Topic: Nanotechnology
Published: 1/1/1992
Author: Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902145

384. The Use of Kinetic-Engergy Distributions to Determine the Relative Contributions of Gas-Phase and Surface Fragmentation in Kiloelectronvolt Ion Sputtering of an Quaternary Ammonium Salt
Topic: Nanotechnology
Published: 4/15/1991
Author: John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902064

385. Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
Topic: Nanotechnology
Published: 1/1/1991
Authors: John G Gillen, Debra L. Kaiser, Jay S. Wallace
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902083

386. Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds
Topic: Nanotechnology
Published: 1/1/1990
Authors: John G Gillen, David S Simons, P. Williams
Abstract: An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynucl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902091

387. Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers
Topic: Nanotechnology
Published: 4/1/1989
Authors: John G Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
Abstract: Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902086

388. Characterization of SRM 1866 Using Spindle Stage Techniques
Series: OTHER
Report Number: 1866
Topic: Nanotechnology
Published: 11/21/1988
Authors: Jennifer R Verkouteren, J M. Phelps, Cynthia J Zeissler, Eric B Steel
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902152

389. SRM 8411: Report of Investigation, Research Material 8411 Mixed Asbestos Research Fiber
Series: OTHER
Topic: Nanotechnology
Published: 11/18/1988
Authors: Eric B Steel, J. J. Sheridan, Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902149

390. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Nanotechnology
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188



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