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Topic Area: Nanotechnology

Displaying records 271 to 280 of 383 records.
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271. Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
Topic: Nanotechnology
Published: 4/5/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Jens Mueller, Donna C. Hurley
Abstract: Atomic force acoustic microscopy (AFAM), an emerging technique that affords nanoscale lateral and depth resolution, was employed to measure the elastic properties of ultrathin films. In this study we measured the indentation modulus M of three nickel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50093

272. Chemical Imaging of Heterogeneous Polymeric Materials With Near-Field IR Microscopy
Topic: Nanotechnology
Published: 4/1/2005
Authors: Chris A Michaels, D B Chase, Stephan J Stranick
Abstract: The development of techniques to probe spatial variations in chemical composition on the nanoscale continues to be an important area of research in the characterization of polymeric materials. Recent efforts have focused on the development and chara ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831470

273. Influence of Tip Wear on Atomic Force Acoustic Microscopy Experiments
Topic: Nanotechnology
Published: 1/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Paul Rice, Donna C. Hurley
Abstract: Tip wear and its corresponding change in geometry is a major impediment for quantifying atomic force acoustic microscopy (AFAM). To better understand the process of tip wear and its influence on AFAM measurements of material elastic properties, we ha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30031

274. Development and Application of Multiple Delta-Layer Reference Materials for Semiconductor Analysis
Topic: Nanotechnology
Published: 1/1/2005
Authors: K J Kim, D Moon, P Chi, David S Simons
Abstract: The rapid progress in the semiconductor industry requires more precise in-depth profiling analysis of doping elements in narrower and shallower regions. Secondary ion mass spectrometry (SIMS) is the most popular technique for the depth distribution o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831369

275. Polycyclic Aromatic Hydrocarbons in Flames, in Diesel Fuels, and in Diesel Emissions
Topic: Nanotechnology
Published: 1/1/2005
Authors: Robert A Fletcher, R Dobbins, Bruce A Benner Jr, S Hoeft
Abstract: Diesel fuels and emissions are composed of numerous hydrocarbon species. Combustion generated or pyrogenic polycyclic aromatic hydrocarbons (PAHs) derived from premixed and diffusion flames often consists of the most stable benzenoid PAHs. In contra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831342

276. Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM
Topic: Nanotechnology
Published: 12/31/2004
Authors: Donna C. Hurley, Tony B. Kos, Paul Rice
Abstract: We describe dynamic atomic force microscopy (AFM) techniques to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) methods that have previously been used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30030

277. Standardization of Isotope Ratio Measurements for Doping Control
Topic: Nanotechnology
Published: 12/1/2004
Author: R Michael Verkouteren
Abstract: Pharmaceutical steroids are known to differ in isotopic composition from those produced naturally in the body. By measuring the ^u13^ C/^u12^C ratio of specific steroids deteched in urine, the technique of Gas Chromatography-Combustion-Isotope Rati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831328

278. Maximum Pixel Spectrum: A New Tool For Detecting And Recovering Rare, Unanticipated Features From Spectrum Image Data Cubes
Topic: Nanotechnology
Published: 11/1/2004
Authors: David S. Bright, Dale E Newbury
Abstract: A new software tool, the Maximum Pixel Spectrum detects rare events within a spectrum image data cube, such as that generated with electron-excited energy dispersive x-ray spectrometry (EDS) in a scanning electron microscope. The Maximum Pixel Spect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831464

279. Dynamic behavior of dagger-shaped atomic force microscope cantilevers
Topic: Nanotechnology
Published: 10/20/2004
Authors: K Shen, Donna C. Hurley, J Turner
Abstract: Experimental techniques based on the atomic force microscope (AFM) have been developed for characterizing mechanical properties at the nanoscale and applied to a variety of materials and structures. Atomic force acoustic microscopy (AFAM) is one such ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50027

280. Automated Analysis of Organic Particles Using Cluster SIMS
Topic: Nanotechnology
Published: 6/1/2004
Authors: John G Gillen, Cynthia J Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A Fletcher, P Chi, Jennifer R Verkouteren, David S. Bright, R Lareau, M Boldman
Abstract: Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831316



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