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Topic Area: Nanotechnology

Displaying records 241 to 250 of 389 records.
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241. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

242. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

243. Mapping Mechanical Properties on the Nanoscale with Atomic Force Acoustic Microscopy
Topic: Nanotechnology
Published: 1/31/2007
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos
Abstract: We are developing tools that use the atomic force microscope (AFM) to measure mechanical properties with nanoscale spatial resolution. Contact-resonance-spectroscopy techniques such as atomic force acoustic microscopy (AFAM) involve the vibrational m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50435

244. Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies
Topic: Nanotechnology
Published: 1/1/2007
Authors: Cynthia J Zeissler, Keana C K Scott, Richard D Holbrook, Peter E. Dr. Barker, Yan Xiao
Abstract: We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902125

245. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831017

246. Elastic mapping and quantitative nanoscale modulus measurements of SnO2 nanobelts
Topic: Nanotechnology
Published: 12/21/2006
Authors: Yuegui Zheng, Robert E. Geer, Malgorzata Kopycinska-Mueller, Donna C. Hurley
Abstract: A comparative study of the elastic uniformity and modulus of single-crystal SnO2 nanobelts is presented employing two nondestructive techniques based on atomic force microscopy: differential ultrasonic force microscopy (d-UFM) and atomic force acoust ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50382

247. After Two Decades a Second Anchor for the VPDB delta-13-C Scale
Topic: Nanotechnology
Published: 11/15/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901931

248. Nanoparticle Lithography and Imaging Scanning Probe Microscopy
Topic: Nanotechnology
Published: 10/1/2006
Authors: Jaroslaw Grobelny, De-Hao D. Tsai, Doo-In Kim, Pradeep Narayanan Namboodiri, Robert Francis Cook, Michael Russel Zachariah
Abstract: Scanning tunnelling microscopy (STM) imaging was performed on goldsurfaces with a large coverage of monodispersed silver nanoparticlessoft-landed on the surface from the gas phase. In both ambient and ultra-highvacuum conditions, STM scanning was fou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850977

249. Competitive Adsorption of PEG, CI^u-^, and SPS/MPS on Cu: An In Situ Ellipsometric Study
Topic: Nanotechnology
Published: 8/1/2006
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: The adsorption of Cu electrodeposition accelerating agents SPS and MPS on evaporated Cu thin films was examined in-situ using spectroscopic ellipsometry under quiescent conditions. Both the thiol (MPS) and disulfide (SPS) resulted in definitive chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831400

250. 3D Molecular Imaging SIMS
Topic: Nanotechnology
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393



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