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Topic Area: Nanotechnology

Displaying records 241 to 250 of 395 records.
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241. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Topic: Nanotechnology
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901934

242. Nanoscale measurements of Poisson's ratio with contact-resonance atomic force microscopy
Topic: Nanotechnology
Published: 8/9/2007
Authors: Donna C. Hurley, J Turner
Abstract: We describe contact-resonance atomic force microscopy (AFM) methods to quantitatively measure Poisson's ratio v or shear modulus G at the same time as Young's modulus E. In contact-resonance AFM, the frequencies of the cantilever's resonant vibration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50507

243. Automated Patterning of Nanoscale Metal-Molecule-Metal Junctions on Self-Assembled Monolayers
Topic: Nanotechnology
Published: 7/1/2007
Authors: J C. Garno, Christopher D Zangmeister, J Batteas
Abstract: Automated scanned probe lithography has been employed to form nanoscale Cu structures through electroless metal deposition onto patterned carboxylic acid terminated self-assembled monolayers. Using this approach, Cu structures of ~ 40 nm 200 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831367

244. RAPID INSPECTION OF CARBON NANOTUBE QUALITY
Topic: Nanotechnology
Published: 7/1/2007
Authors: Stephanie A Hooker, Roy Howard Geiss, Aparna Kar
Abstract: Carbon nanotubes have unique properties of interest for applications in aerospace, electronics, and biotechnology. However, the properties of different batches of carbon nanotubes can vary considerably depending on chemical purity and the nanotube ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50489

245. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Topic: Nanotechnology
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902088

246. Nanostructured, multifunctional tribological coatings
Topic: Nanotechnology
Published: 5/1/2007
Authors: In-Wook Park, Jianliang Lin, William C. Moerbe, Brajendra Mishra, John J. Moore, Jennifer Anton, William D. Sproul, Kwang Ho Kim, Audrey A. Vooevodin, Evgeny A. Levashov
Abstract: A number of multicomponents, nanostructured coatings have been produced for a range of tribological applications. This paper will discuss four such nanocomposite coating systems: (i) Ti-Si-B-C-N; (ii) Cr-B-N; (iii) TiC-C and (iv) Cr-Al-N produced by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50546

247. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

248. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

249. Mapping Mechanical Properties on the Nanoscale with Atomic Force Acoustic Microscopy
Topic: Nanotechnology
Published: 1/31/2007
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos
Abstract: We are developing tools that use the atomic force microscope (AFM) to measure mechanical properties with nanoscale spatial resolution. Contact-resonance-spectroscopy techniques such as atomic force acoustic microscopy (AFAM) involve the vibrational m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50435

250. Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies
Topic: Nanotechnology
Published: 1/1/2007
Authors: Cynthia J Zeissler, Keana C K Scott, Richard D Holbrook, Peter E. Dr. Barker, Yan Xiao
Abstract: We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902125



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