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Displaying records 51 to 60 of 100 records.
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51. Evolution of Modern Approaches to Express Uncertainty in Measurement
Topic: Math
Published: 11/27/2007
Authors: Raghu N Kacker, K D Sommer, Bernd Siebert
Abstract: The object of this paper is to discuss evolution of the concept of uncertainty in measurement and methods for its quantification from the classical error analysis to the modern approaches based on the Guide to the Expression of Uncertainty in Measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51120

52. Evolutionary Construction of de Bruijn Sequences
Topic: Math
Published: 7/20/2012
Author: Meltem Sonmez Turan
Abstract: A binary de Bruijn sequence of order n is a cyclic sequence of period 2^n, in which each n-bit pattern appears exactly once. These sequences are commonly used in applications such as stream cipher design, pseudo-random number generation, 3-D pattern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909087

53. Expansions for a fundamental solution of Laplace's equation on R^u3^ in 5-cyclidic harmonics
Topic: Math
Published: 10/14/2014
Authors: Howard S Cohl, Hans Volkmer
Abstract: We derive eigenfunction expansions for a fundamental solution of Laplace's equation in three-dimensional Euclidean space in 5-cyclidic coordinates. There are three such expansions in terms of internal and external 5-cyclidic harmonics of first, seco ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914742

54. Fast Iterative Solver for Convection-Diffusion Systems with Spectral Elements
Topic: Math
Published: 10/16/2009
Authors: Aaron Lott, Howard Elman
Abstract: We introduce a solver and preconditioning technique based on Domain Decomposition and the Fast Diagonalization Method that can be applied to tensor product based discretizations of the steady convection-diffusion equation. The method is based on iter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901466

55. Fault Localization Based on Failure-Inducing Combinations
Topic: Math
Published: 11/7/2013
Author: Raghu N Kacker
Abstract: Combinatorial testing has been shown to be a very effective testing strategy. After a failure is detected, the next task is to identify the actual fault that causes the failure. In this paper, we present an approach to fault localization that le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913018

56. Five Examples of Assessment and Expression of Measurement Uncertainty
Topic: Math
Published: 2/12/2013
Author: Antonio M Possolo
Abstract: It is a long accepted tenet of scientific practice that every measurement result ought to include a statement of uncertainty associated with the measured value, and that such uncertainty should be propagated to derivative products. It is also widely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910812

57. Fourier, Gegenbauer and Jacobi expansions for a power-law fundamental solution of the polyharmonic equation and polyspherical addition theorems
Topic: Math
Published: 6/5/2013
Author: Howard S Cohl
Abstract: We develop complex Jacobi, Gegenbauer and Chebyshev polynomial expansions for the kernels associated with power-law fundamental solutions of the polyharmonic equation on d-dimensional Euclidean space. From these series representations we derive Fouri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912042

58. Front Matter for Special Issue of NIST Journal of Research in honor of Christoph Witzgall
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 3/31/2006
Authors: David E. Gilsinn, Ronald F Boisvert
Abstract: This front matter for a special issue of the NIST Journal of Research contains a photograph and biography of Christoph Witzgall. It also contains a thank you paragraph by Christoph Witzgall for a symposium held in his honor. Many of the papers in thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150660

59. IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Topic: Math
Published: 11/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combination ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50964

60. IPOG: A General Strategy for t-Way Software Testing
Topic: Math
Published: 3/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50944



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