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Displaying records 51 to 60 of 99 records.
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51. Evolutionary Construction of de Bruijn Sequences
Topic: Math
Published: 7/20/2012
Author: Meltem Sonmez Turan
Abstract: A binary de Bruijn sequence of order n is a cyclic sequence of period 2^n, in which each n-bit pattern appears exactly once. These sequences are commonly used in applications such as stream cipher design, pseudo-random number generation, 3-D pattern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909087

52. Expansions for a fundamental solution of Laplace's equation on R^u3^ in 5-cyclidic harmonics
Topic: Math
Published: 10/14/2014
Authors: Howard S Cohl, Hans Volkmer
Abstract: We derive eigenfunction expansions for a fundamental solution of Laplace's equation in three-dimensional Euclidean space in 5-cyclidic coordinates. There are three such expansions in terms of internal and external 5-cyclidic harmonics of first, seco ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914742

53. Fast Iterative Solver for Convection-Diffusion Systems with Spectral Elements
Topic: Math
Published: 10/16/2009
Authors: Aaron Lott, Howard Elman
Abstract: We introduce a solver and preconditioning technique based on Domain Decomposition and the Fast Diagonalization Method that can be applied to tensor product based discretizations of the steady convection-diffusion equation. The method is based on iter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901466

54. Fault Localization Based on Failure-Inducing Combinations
Topic: Math
Published: 11/7/2013
Author: Raghu N Kacker
Abstract: Combinatorial testing has been shown to be a very effective testing strategy. After a failure is detected, the next task is to identify the actual fault that causes the failure. In this paper, we present an approach to fault localization that le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913018

55. Five Examples of Assessment and Expression of Measurement Uncertainty
Topic: Math
Published: 2/12/2013
Author: Antonio M Possolo
Abstract: It is a long accepted tenet of scientific practice that every measurement result ought to include a statement of uncertainty associated with the measured value, and that such uncertainty should be propagated to derivative products. It is also widely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910812

56. Fourier, Gegenbauer and Jacobi expansions for a power-law fundamental solution of the polyharmonic equation and polyspherical addition theorems
Topic: Math
Published: 6/5/2013
Author: Howard S Cohl
Abstract: We develop complex Jacobi, Gegenbauer and Chebyshev polynomial expansions for the kernels associated with power-law fundamental solutions of the polyharmonic equation on d-dimensional Euclidean space. From these series representations we derive Fouri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912042

57. Front Matter for Special Issue of NIST Journal of Research in honor of Christoph Witzgall
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 3/31/2006
Authors: David E. Gilsinn, Ronald F Boisvert
Abstract: This front matter for a special issue of the NIST Journal of Research contains a photograph and biography of Christoph Witzgall. It also contains a thank you paragraph by Christoph Witzgall for a symposium held in his honor. Many of the papers in thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150660

58. IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Topic: Math
Published: 11/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combination ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50964

59. IPOG: A General Strategy for t-Way Software Testing
Topic: Math
Published: 3/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50944

60. Identifying Failure-Inducing Combinations in a Combinatorial Test Set
Topic: Math
Published: 4/17/2012
Author: Raghu N Kacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911457



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