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Topic Area: Optical Technology
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Displaying records 1 to 10 of 25 records.
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1. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Optical Technology
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914149

2. Harnessing 3D Scattered Optical Fields for sub-20 nm Defect Detection
Topic: Optical Technology
Published: 6/24/2013
Authors: Bryan M Barnes, Martin Y Sohn, Francois R. Goasmat, Hui Zhou, Richard M Silver, Abraham Arceo
Abstract: Experimental imaging at =193 nm of sub-resolved defects performed at several focus positions yields a volume of spatial and intensity data. Defects are located in a differential volume, given a reference, with up to 5x increase in sensitivity ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913510

3. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Technology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913528

4. Chapter 13. Color Quality of White LEDs
Topic: Optical Technology
Published: 5/24/2013
Author: Yoshihiro Ohno
Abstract: This chapter overviews the fundamentals of chromaticity and color rendering as the two important aspects of color quality of light sources for general illumination, with special focus on the use for solid state light sources. The section for chrom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912950

5. Metrology for Lab-on-a-Chip Final-Product Devices
Topic: Optical Technology
Published: 5/12/2013
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: New metrology tools to measure the critical parameters of internal structures in lab on a chip devices are greatly needed in order to develop standard tests for this technology. Here we present a method that combines a custom made optical coherence ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913496

6. Random testing reveals excessive power in commercial laser pointers
Topic: Optical Technology
Published: 5/1/2013
Authors: Joshua Aram Hadler, Edna L Tobares, Marla L Dowell
Abstract: In random testing of 122 commercial laser pointers, we observed that 89.7 % of green pointers and 44.4 % of red pointers were not in compliance with the Code of Federal Regulations, producing laser power in excess of the Accessible Emission Limit at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912603

7. Standardization of Broadband UV Measurements
Topic: Optical Technology
Published: 1/1/2013
Author: George P Eppeldauer
Abstract: The CIE standardized rectangular-shape UV response functions can be realized only with large spectral mismatch errors. The spectral power-distribution of UV sources is not standardized. Accordingly, the readings of different types of UV meters, even ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913173

8. Performance of the NIST goniometer with a broad-band source and multichannel CCD based spectrometer
Topic: Optical Technology
Published: 9/20/2012
Authors: Vyacheslav B Podobedov, Maria E Nadal, Carl C Miller
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909880

9. High Resolution THz Optical Absorption Study of Antiferromagnetic Magnons in Hematite (alpha-Fe2O3)
Topic: Optical Technology
Published: 7/9/2012
Authors: Shin G. Chou, David F Plusquellic, Paul E Stutzman, Shuangzhen S. Wang, Edward Joseph Garboczi
Abstract: We report the high resolution optical measurement for the temperature dependence of the antiferromagnetic resonance (AFMR) transition in alpha-Fe2O3 between (0.5 and 10)cm-1. We found that below the Morin transition temperature when the spins are pe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909800

10. The Pan-STARRS1 Photometric System
Topic: Optical Technology
Published: 5/10/2012
Authors: J. L. Tonry, Christopher W Stubbs, Keith R Lykke, Peter Doherty, I. S. Shivvers, W. S. Burgett, K. C. Chambers, K. W Hodapp, N. Kaiser, R -P Kudritzki, E. A. Magnier, J. S, Morgan, P. A. Price, R. J. Wainscoat
Abstract: The Pan-STARRS1 survey is collecting multi-epoch, multi-color observations of the sky north of declination −30 to unprecedented depths. These data are being photometrically and astrometrically calibrated and will serve as a reference for man ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910780



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