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Topic Area: Synchrotron

Displaying records 1 to 10 of 13 records.
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1. Bromination of marine particulate organic matter through oxidative mechanisms
Topic: Synchrotron
Published: 9/14/2014
Authors: Bruce D Ravel, Alessandra C Leri, Kathleen Thornton, Lawrence M Mayer
Abstract: Although bromine is considered conservative in seawater, it exhibits a well established correlation with organic carbon in marine sediments. This carbon-bromine association was recently attributed to covalent bonding, with organobromine in sinking pa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915663

2. Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source
Topic: Synchrotron
Published: 8/25/2014
Authors: Uwe Arp, Alexander Sorokin, Ulf Jastrow, Pavle Jurani?, Svea Kreis, Mathias Richter, Yiping Feng, Dennis Nordlund, Kai Tiedtke, Philip Heimann, Bob Nagler, Hae Ja Lee, Stephanie Mack, Marco Cammarata, Oleg Krupin, Marc Messerschmidt, Michael Holmes , Michael Rowen, William Schlotter, Stefan Moeller, Joshua Turner
Abstract: This paper reports novel measurements of x-ray optical radiation on an absolute scale from a recently developed source of radiation generated in the soft x-ray regime of a free electron laser. We give a brief description of the physics behind the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916074

3. Non-destructive Measurement of the Residual Stresses in Copper Through-Silicon Vias using Synchrotron Based Micro-beam X-ray Diffraction
Topic: Synchrotron
Published: 7/1/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Yaw S Obeng, Klaus Hummler, Ruqing Xu
Abstract: In this study, we report a new method for achieving depth resolved determination of the full stress tensor in buried Cu through-silicon vias (TSVs), using synchrotron based X-ray micro-diffraction technique. Two adjacent Cu TSVs were analyzed; on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915348

4. Synchrotron-Based Measurement of the Impact of Thermal Cycling on the Evolution of Stresses in Cu Through-Silicon Via
Topic: Synchrotron
Published: 6/30/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Ruqing Xu, Klaus Hummler, Yaw S Obeng
Abstract: One of the main causes of failure during the lifetime of microelectronics devices is their exposure to fluctuating temperatures. In this work, synchrotron-based X-ray micro-diffraction is used to study the evolution of stresses in copper through-sili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915982

5. X-Ray Micro-Beam Diffraction Measurement of the Effect of Thermal Cycling on Stress in Cu TSV: A Comparative Study
Topic: Synchrotron
Published: 5/26/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Yaw S Obeng, Klaus Hummler, Ruqing Xu
Abstract: Microelectronic devices are subjected to constantly varying temperature conditions during their operational lifetime, which can lead to their failure. In this study, we examined the impact of thermal cycling on the evolution of stresses in Cu TSVs us ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915644

6. National Synchrotron Light Source II: Long Islands state-of-the-art X-ray microscope
Topic: Synchrotron
Published: 5/20/2014
Authors: Bruce D Ravel, Scott Calvin, Linnea Russell
Abstract: This is an education and outreach effort that we have undertaken for the benefit of the Photon Sciences Users' Executive Committee. The UEC is the group that represents the user of the National Synchrotron Light Source, which is currently in its fina ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915664

7. Sample Thickness and Quantitative Concentration Measurements in XANES Spectroscopy
Topic: Synchrotron
Published: 5/16/2014
Authors: Alessandra C Leri, Bruce D Ravel
Abstract: While XANES spectroscopy is an established tool for quantitative information on chemical structure and speciation, elemental concentrations are generally quantified by other methods. The edge step in XANES spectra represents the absolute amount of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915146

8. X-Ray Micro-Beam Diffraction Determination of Full Stress Tensors in Cu TSVs
Topic: Synchrotron
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Oleg A Kirillov, Yaw S Obeng, Ruqing Xu, Jonathan Z Tischler, Wenjun Liu, Klaus Hummler
Abstract: We report the first non-destructive, depth resolved determination of the full stress tensor in Cu through-silicon vias (TSVs), using synchrotron based micro-beam X-ray diffraction. Two adjacent Cu TSVs were studied; one deliberately capped with SiO2, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913440

9. Ultra-Small-Angle X-ray Scattering,X-ray Photon Correlation Spectroscopy: A New Measurement Technique for in-situ Studies of Equilibrium and Nonequilibrium Dynamics
Topic: Synchrotron
Published: 5/1/2012
Authors: Fan Zhang, Andrew John Allen, Lyle E Levine, Jan Ilavsky, Gabrielle G. Long
Abstract: Ultra-small-angle X-ray scattering,X-ray photon correlation spectroscopy (USAXS-XPCS) is a novel measurement technique for the study of equilibrium and slow nonequilibrium dynamics in disordered materials. This technique fills an existing gap between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907783

10. The NIST EUV facility for advanced photoresist qualification using the witness-sample test
Topic: Synchrotron
Published: 8/29/2011
Authors: Steven E Grantham, Charles S Tarrio, Shannon Bradley Hill, Lee J Richter, Thomas B Lucatorto, J. van Dijk, C. Kaya, N. Harned, R. Hoefnagels, M. Silova, J. Steinhoff
Abstract: Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be qualified to ensure that they will not excessively contaminate the scanner optics or other parts of the vacuum environment of the scanner. At the National Institute ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908029



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