NIST logo

Publications Portal

You searched on:
Topic Area: Radiation Physics

Displaying records 1 to 10 of 81 records.
Resort by: Date / Title


1. New x-ray measurements shed light on discrepancy between experiment and QED
Topic: Radiation Physics
Published: 12/15/2014
Authors: Lawrence T Hudson, C T Chantler, A.T. Payne, M N Kinnane, John D Gillaspy, L F Smale, Albert Henins, J A Kimpton, E Takacs
Abstract: Quantum Electro-Dynamics (QED) is the best tested theory of our physical world, yet significant disagreements have emerged between attempts to apply QED to exotic atomic systems. A recent 15 parts-per-million (ppm) experiment on muonic hydrogen, in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912845

2. Ultra-Thin Curved Transmission Crystals for High Resolving Power (up to E/¿E=6300) X-Ray Spectroscopy in the 6 keV to 13 keV Energy Range
Topic: Radiation Physics
Published: 12/9/2014
Authors: Lawrence T Hudson, John F Seely, Jack Leigh Glover, Albert Henins, Nino R. Pereira
Abstract: Ultra-thin curved transmission crystals operating in the Cauchois spectrometer geometry were evaluated for the purpose of achieving high spectral resolution in the 6 keV to 13 keV x-ray energy range. The crystals were silicon (111) and sapphire R- cu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917296

3. New Methods for Measurement of Neutron Detector Efficiency up to 20 MeV
Topic: Radiation Physics
Published: 12/1/2014
Authors: Fred B Bateman, Allan David Carlson, N. A. Kornilov, S M Grimes, T N Massey, C E Brient, D E. Carter, J E. O'Donnell, R. C. Haight, N Boukharouba
Abstract: A new approach to neutron detector effciency has been taken. A neutron detector has been calibrated with a Cf-252 source at low energy. The calibration was extended to higher neutron energies by use of symetric reactions such as A + A ! (2A - 1) + ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913634

4. The Metrology of a Rastered Spot of X Rays used in Security Screening
Series: Journal of Research (NIST JRES)
Report Number: 119
Topic: Radiation Physics
Published: 11/6/2014
Authors: Lawrence T Hudson, Jack Leigh Glover, Ronaldo Minniti
Abstract: In recent times, ionizing radiation has been used around the world to screen persons for non-medical purposes, namely to detect bulk explosives or other contraband hidden on the body including materials not registered by metal detectors. In contrast ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916722

5. New National Air-Kerma Standard for Low-Energy Electronic Brachytherapy Sources
Series: Journal of Research (NIST JRES)
Topic: Radiation Physics
Published: 10/6/2014
Authors: Stephen Michael Seltzer, C Michelle O'Brien, Michael G Mitch
Abstract: The purpose of this report is to document the NIST air-kerma measurement standard for the electronic brachytherapy sources, i.e., the Axxent sources of Xoft, Inc., which operate at tube potentials of 50 kV and anode currents of 300 μA. The use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916273

6. Comparisons of the radiation protection standards for air kerma of the NIST and the BIPM for Co60 and Cs137 gamma radiation
Topic: Radiation Physics
Published: 8/1/2014
Authors: Ronaldo Minniti, C. Kessler, P J Allisy-Roberts
Abstract: An indirect comparison of the standards for air kerma of the National Institute of Standards and Technology (NIST), USA, and of the Bureau International des Poids et Mesures (BIPM) was carried out in the Co60 and Cs137 radiation protection-level beam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915926

7. Post-Irradiation Study of the Alanine Dosimeter
Series: Journal of Research (NIST JRES)
Topic: Radiation Physics
Published: 7/14/2014
Author: Marc F Desrosiers
Abstract: Post-irradiation stability of high-dose dosimeters has traditionally been an important measurement influence quantity. Though the exceptional stability of the alanine dosimeter response with time has rendered this factor a non-issue for routine work ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914295

8. Influence of phantom materials on the energy dependence of LiF:Mg,Ti exposed to low-energy x-rays
Topic: Radiation Physics
Published: 7/8/2014
Authors: Ronaldo Minniti, G. Massillon, Christopher Graham Soares
Abstract: Thermoluminescent (TL) dosimeters, particularly LiF:Mg,Ti (commercially known as TLD-100), are widely used to estimate the absorbed dose received by patients during diagnostic and/or treatment processes and for convenience, measurements are usually m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913210

9. Spin-exchange optical pumping of He3 with VHG-narrowed diode bar laser
Topic: Radiation Physics
Published: 7/2/2014
Authors: Thomas R. Gentile, Wei-Chen N. Chen, T G Walker, E Babcock, Qiang NMN Ye
Abstract: Using diode bar lasers spectrally narrowed with chirped volume holographic gratings (VHGs), we have obtained an improvement in the 3He polarization achievable by spin-exchange optical pumping (SEOP). As compared to our past results with lasers narro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914927

10. Effects of Dose Fractionation on the Response of Alanine Dosimetry
Topic: Radiation Physics
Published: 6/28/2014
Authors: Marc F Desrosiers, John Logar, Brad Lundahl
Abstract: Alanine dosimetry is well established as a transfer standard and is becoming more prevalently used as a routine dosimetry system for radiation processing. Many routine measurement applications in radiation processing involve absorbed dose measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916033



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series