Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Optical Metrology

Displaying records 1 to 10 of 67 records.
Resort by: Date / Title


1. Centroid and Orientation Precision of Localization Microscopy
Topic: Optical Metrology
Published: 3/11/2016
Authors: Craig Dyer McGray, Craig Robert Copeland, Samuel M Stavis, Jon C Geist
Abstract: The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918105

2. Multifocus microscopy with precise color multi-phase diffractive optics applied in functional neuronal imaging
Topic: Optical Metrology
Published: 3/1/2016
Authors: Sara Abrahamsson, Bojan R Ilic, Jan Wisniewski, Brian Mehl, Liya Yu, Lei Chen, Marcelo Ishihara Davanco, Laura Oudjedi, Jean Bernard Fiche, Bassam Hajj, Xin Jin, Joan Pulupa, Christine Cho, Mustafa Mir, Mohamed El Beheiry, Xavier Darzacq, Marcelo Nollmann, Maxime Dahan, Carl Wu, Timothee Lionnett, James Alexander Liddle, Cornelia Bargmann
Abstract: Multifocus microscopy (MFM) allows high-resolution instantaneous three-dimensional (3D) imaging and has been applied to study biological specimens ranging from single molecules inside cell nuclei to entire embryos. In any live microscopy application, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919743

3. Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization
Topic: Optical Metrology
Published: 11/5/2015
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Ronald G Dixson, Mark Alexander Henn
Abstract: Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914423

4. Defining the visual adaptation field for mesopic photometry: How does a high-luminance source affect peripheral adaptation?
Topic: Optical Metrology
Published: 10/25/2015
Authors: Yoshihiro Ohno, Tatsukiyo Uchida
Abstract: CIE 191:2010 recommends the mesopic photometry system, in which the luminous efficiency function is determined from the adaptation luminance. However, it cannot be practically implemented because the adaptation field to determine the adaptation l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917534

5. On-Chip Integrated Silicon Photonic Thermometers
Topic: Optical Metrology
Published: 9/1/2015
Authors: Nikolai Nikolayevich Klimov, Thomas P Purdy, Zeeshan Ahmed
Abstract: The fundamental limitations of resistance-based thermometry and the desire to reduce sensor ownership have produced considerable interest in the development of photonics-based temperature sensors as an alternative to resistance thermometers. Photonic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919132

6. Integrated silicon optomechanical transducers and their application in atomic force microscopy
Topic: Optical Metrology
Published: 7/31/2015
Authors: Jie J. Zou, Marcelo Ishihara Davanco, Yuxiang Liu, Thomas Michels, Kartik A Srinivasan, Vladimir A Aksyuk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914874

7. MEMS optomechanical accelerometry standards
Topic: Optical Metrology
Published: 7/8/2015
Authors: Felipe Guzman, Yiliang Bao, Jason John Gorman, John Russell Lawall, Jacob M Taylor, Thomas W LeBrun
Abstract: Current acceleration primary standards reach relative uncertainties of the order of 0.001 and consist of complex test facilities, typically operated at National Metrology Institutes. Our research focuses on the development of silicon mechanical os ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918899

8. Optomechanical Motion Sensors
Topic: Optical Metrology
Published: 7/8/2015
Authors: Felipe Guzman, Oliver Gerberding, John T. Melcher, Julian Stirling, Jon Robert Pratt, Gordon Allan Shaw, Jacob M Taylor
Abstract: Compact optical cavities can be combined with motion sensors to yield unprecedented resolution and SI-traceability in areas such as acceleration sensing and atomic force microscopy AFM, among others. We have incorporated Fabry-Perot fiber-optic m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918898

9. Single-Photon Detector Calibration
Topic: Optical Metrology
Published: 7/7/2015
Author: Sergey V Polyakov
Abstract: In this chapter we introduce the set of detector properties, common to most contemporary detectors, that should be determined for a complete characterization. Then we introduce methods for detector characterization, and finally we present practical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914455

10. 110 Labs in World‰s Largest Interlaboratory Comparison of LED Test Labs ‹ improving testing competency to support market transformation
Topic: Optical Metrology
Published: 6/1/2015
Authors: Yoshihiro Ohno, Koichi Nara, Peter Bennich, Michael Scholand, Nils Borg
Abstract: The International Energy Agency (IEA) 4E Solid State Lighting Annex initiated a programme starting in 2011 looking at a global laboratory accreditation scheme. The 2013 Interlaboratory Comparison (IC 2013) brought together and compared test results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917990



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series