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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 1 to 10 of 204 records.
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1. Pseudomagnetic Fields in a Locally Strained Graphene Drumhead
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/25/2014
Authors: Shuze Zhu, Yinjun Huang, Nikolai Nikolayevich Klimov, David B Newell, Nikolai B Zhitenev, Joseph A Stroscio, Santiago de Jesus Solares Rivera, Teng Li
Abstract: Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine graphene charg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915987

2. Analysis of the Noise Spectra from Oxidized Superparamagnetic Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/18/2014
Authors: Solomon I Woods, Snorri Ingvarsson, Shouheng Sun, John Kirtley
Abstract: Expressions for the thermal noise from a collection of exchange-biased magnetic nanoparticles are derived and used to analyze the magnetic noise from thin films of partially oxidized nanoparticles. Functionalized Co nanoparticles with diameters betw ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915838

3. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

4. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/29/2014
Authors: Ravikiran (Ravikiran) Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

5. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

6. High-speed, high-purity separation of gold nanoparticle‹DNA origami constructs using centrifugation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Seung H. Ko, Luis Fernando Vargas Lara, Paul N. Patrone, Samuel M Stavis, Francis Starr, Jack F Douglas, James Alexander Liddle
Abstract: DNA origami is a powerful platform for assembling gold nanoparticle constructs, an important class of nanostructure with numerous applications. Such constructs are assembled by the association of complementary DNA oligomers. These association reactio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915009

7. Pattern Transfer of 3D structures into silicon with atomically traceable placement and size control
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

8. Quasiparticle scattering from topological crystalline insulator SnTe (001) surface states
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/27/2014
Authors: Duming Zhang, Hongwoo Baek, Jeonghoon Ha, Tong Zhang, Jonathan E Wyrick, Albert Davydov, Young Kuk, Joseph A Stroscio
Abstract: Recently, the topological classification of electronic states has been extended to a new class of matter known as topological crystalline insulators. Similar to topological insulators, topological crystalline insulators also have spin-momentum locked ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915976

9. Intermittent contact resonance atomic force microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2014
Authors: Gheorghe Stan, Richard Swift Gates
Abstract: The intermittent contact resonance atomic force microscopy (ICR-AFM) mode proposed here is a new frequency modulation technique performed in scanning force controlled AFM modes like force volume or peak force tapping. It consists of tracking the chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914896

10. Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Jan Obrzut, Nathan Daniel Orloff, Oleg A Kirillov
Abstract: A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914908



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