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Topic Area: Electric Power Metrology

Displaying records 1 to 10 of 35 records.
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1. Testing Phasor Measurement Units Using IEEE 1588 Precision Time Protocol
Topic: Electric Power Metrology
Published: 7/1/2012
Authors: Julien Marc Amelot, Gerard Stenbakken
Abstract: As the electric power grid is changing to a smarter more dynamically controlled system, there is increasing need for measurements that show the global status of the system for wide-area monitoring and control. These measurements require time synchron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910573

2. Performance of Hybrid 4.5kV SiC JBS Freewheeling Diode and Si IGBT
Topic: Electric Power Metrology
Published: 9/16/2011
Authors: Karl Hobart, Eugene Imhoff, F. J. Kub, Allen R Hefner Jr, Tam Hoang Duong, Jose Miguel Ortiz, Sei-Hyung Ryu, David Grider, Scott G Leslie, Jerry Sherbondy, B Ray
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909897

3. Comparison of Au-In Transient Liquid Phase Bonding Designs for SiC Power Semiconductor Device Packaging
Topic: Electric Power Metrology
Published: 7/18/2011
Authors: Brian Joseph Grummel, Z. John Shen, Allen R Hefner Jr
Abstract: Transient liquid phase (TLP) bonding is an advanced die-attach technique for wide-bandgap power semiconductor and high-temperature packaging. TLP bonding advances current soldering techniques by raising the melting point to over 500 °C without detrim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909898

4. Electro-thermal-mechanical Simulation and Reliability for Plug-in Vehicle Converters and Inverters
Topic: Electric Power Metrology
Published: 2/24/2011
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908465

5. NIST Framework and Roadmap for Smart Grid Interoperability Standards Release 1.0
Series: Special Publication (NIST SP)
Report Number: 1108
Topic: Electric Power Metrology
Published: 1/10/2011
Authors: George W Arnold, David A Wollman, Gerald J FitzPatrick, Dean Eldon Prochaska, Annabelle Lee, David G Holmberg, David H Su, Allen R Hefner Jr, Nada T Golmie, Eric D Simmon, Tanya L Brewer, Mark Bello, Paul A Boynton
Abstract: Under the Energy Independence and Security Act (EISA) of 2007, the National Institute of Standards and Technology (NIST) is assigned “primary responsibility to coordinate development of a framework that includes protocols and model standards for info ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904712

6. Smart Grid Integration of Renewables, Storage, and Plug-in Vehicles
Topic: Electric Power Metrology
Published: 10/6/2010
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907125

7. Modeling the Inter-Electrode Capacitances of Si CoolMOSTM Transistors for Circuit Simulation in High Efficiency Power Systems
Topic: Electric Power Metrology
Published: 9/12/2010
Authors: Nanying Yang, Jose Miguel Ortiz, Tam Hoang Duong, Allen R Hefner Jr, Kathleen Meehan
Abstract: The CoolMOSTM transistor is a novel power MOSFET type device that utilizes a super-junction embedded within its drift region in order to improve the trade-off between on-resistance and breakdown voltage. The super-junction results in unique inter-e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905983

8. Smart Grid Standards and Power Electronics Technologies to Enable High Penetration of Renewable Energy
Topic: Electric Power Metrology
Published: 8/31/2010
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907122

9. Computer-Controlled Thermal Cycling Tool to Aid in SiC Module Package Characterization
Topic: Electric Power Metrology
Published: 6/30/2010
Authors: Madelaine Herminia Hernandez, Jose Miguel Ortiz, Brian Joseph Grummel, Allen R Hefner Jr, David W. Berning, Colleen E. Hood, Patrick McCluskey
Abstract: A software-controlled thermal cycling test system developed for SiC module package characterization is presented. Its interface permits the flexible definition of testing parameters like variable data acquisition rates and customizable cycle transiti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905974

10. Automated Parameter Extraction Software for Silicon and High-Voltage Silicon Carbide Power Diodes
Topic: Electric Power Metrology
Published: 6/24/2010
Authors: Nanying Yang, Tam Hoang Duong, Jeong-O Jeong, Jose Miguel Ortiz, Allen R Hefner Jr, Kathleen Meehan
Abstract: This paper presents an automated parameter extraction software tool developed for constructing Silicon (Si) and Silicon Carbide (SiC) power diode models, which is called DIode Model Parameter extrACtion Tools (DIMPACT). This software tool extracts th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905858