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You searched on: Topic Area: Nanotechnology

Displaying records 1 to 10 of 214 records.
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1. Design and modeling of an ultra-compact 2x2 nanomechanical plasmonic switch
Topic: Nanotechnology
Published: 5/4/2016
Author: Vladimir A Aksyuk
Abstract: A 2x2 Mach-Zehnder optical switch design with a footprint of 0.5 um x 2.5 um using nanomechanical gap plasmon phase modulators [1] is presented. The extremely small footprint and modest optical loss are enabled by the strong phase modulation of gap p ...

2. UV-assisted NO2 sensing at room temperature using rf-sputtered TiO2 thin film
Topic: Nanotechnology
Published: 12/25/2015
Authors: Ting Xie, Nichole Sullivan, Kristen L. Steffens, Baomei Wen, Guannan Liu, Ratan Kumar Debnath, Albert Davydov, Romel D. Gomez, Abhishek Motayed
Abstract: A TiO2 thin film based NO2 sensor that operates at room temperature under ultraviolet (UV) illumination was fabricated via radio frequency (rf) sputtering. The sputter-deposited TiO2 films, after 30 s annealing at 700 ⁰C in Ar, were investigate ...

3. Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation
Topic: Nanotechnology
Published: 11/17/2015
Authors: Michael T Postek, Andras Vladar
Abstract: This is the fourth part of a series of tutorial papers discussing various causes of measurement uncertainty in scanned particle beam instruments, and some of the solutions researched and developed at NIST and other research institutions. Scanned part ...

4. Strategies for transmission electron microscopy specimen preparation of polymer composites
Series: Special Publication (NIST SP)
Report Number: 1200-16
Topic: Nanotechnology
Published: 9/29/2015
Authors: Keana C K Scott, Lucille A Giannuzzi

5. Quantitative Measurement of Resolution as a Function of Defocus in Different Microscopy Modalities Using a Simplified Technique
Topic: Nanotechnology
Published: 9/23/2015
Authors: Aric Warner Sanders, Alexandra E Curtin, Ryan Skinner
Abstract: The distance over which the resolution of a microscope image changes appreciably, related to the depth of field, is an important parameter. This value determines the height of an object that can be imaged and said to be ,in focusŠ. Although this dist ...

6. Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics
Topic: Nanotechnology
Published: 9/23/2015
Authors: Aric Warner Sanders, Anna E Fox, Paul David Dresselhaus
Abstract: Superconducting electronics is an established technological field for sensors, quantum computation and quantum-based standards and is emerging as an important low-power alternative to semiconductors. As in any electronics fabrication, the production ...

7. A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
Topic: Nanotechnology
Published: 9/10/2015
Authors: Hyeong Gon (Hyeonggon) Kang, Ravikiran Attota, Premsagar Purushotham Kavuri, Vipin Nagnath Tondare, Andras Vladar

8. Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy
Topic: Nanotechnology
Published: 9/5/2015
Authors: Aric Warner Sanders, Jaevyn Faulk, Devin Thomas Edwards, Thomas T Perkins
Abstract: In addition to providing the ability to image on the nanoscale, atomic force microscopy (AFM) has the ability to measure small (pN) forces at a single point. This ability has led to new insights into conformation changes in biological molecules; in p ...

9. Linear relation between Heisenberg exchange and interfacial Dzyaloshinskii‹Moriya interaction in metal films
Topic: Nanotechnology
Published: 8/3/2015
Authors: Hans Toya Nembach, Justin M Shaw, Mathias A. Weiler, Emilie Marie Jue, Thomas J Silva
Abstract: Proposals for novel spin-orbitronic logic and memory devices are often dependent on assumptions as to how materials with large spin-orbit and ferromagnets interact when in contact. Such interactions give rise to a host of novel phenomena, such as spi ...

10. Protocols for Accelerating Laboratory Weathering and Measurements of Degradation of Polymer-Multiwalled Carbon Nanotube Composites
Series: Special Publication (NIST SP)
Report Number: 1200-15
Topic: Nanotechnology
Published: 8/3/2015
Authors: Li Piin Sung, Tinh Nguyen
Abstract: Polymer nanocomposites containing multi-walled carbon nanotubes (MWCNTs) are increasingly or potentially will be used in many large-volume industries. These advanced composites are exposed to severe mechanical and environmental stresses, such that, d ...

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