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You searched on: Topic Area: Optical Technology

Displaying records 1 to 10 of 19 records.
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1. Quantitative scheme for full-field polarization rotating fluorescence microscopy (PROM) using a liquid crystal variable retarder
Topic: Optical Technology
Published: 5/14/2015
Authors: John F. Lesoine, Ji Y. Lee, Hyeong Gon Kang, Matthew Lawrence Clarke, Robert C. Chang, Ralph Nossal, Jeeseong Hwang
Abstract: We introduce real-time, full-field, polarization rotating fluorescence microscopy (PROM) to monitor the absorption dipole orientations of fluorescent molecules. A quarter-wave plate, in combination with a liquid crystal variable retarder (LCVR ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908548

2. Dimensional Metrology of Lab on a Chip Internal Structures: a Comparison of Optical Coherence Tomography with Coherence Fluorescence Microscopy
Topic: Optical Technology
Published: 4/8/2015
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: The characterization of internal structures in a polymeric device, specifically of a final product, will require a different set of metrology techniques than those traditionally use in the characterization of microelectronic devices. OCT is relative ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912533

3. IR-enhanced Si reference detectors for 1-step scale transfers from 300 nm to 1000 nm
Topic: Optical Technology
Published: 11/20/2014
Authors: George P Eppeldauer, Thomas C Larason, Jeanne M Houston, Robert Edward Vest, Uwe Arp, Howard W Yoon
Abstract: IR-enhanced Si photodiodes have improved radiometric and electronic characteristics as compared to other widely used Si photodiodes and can be used as responsivity standards in the wavelength range from 300 nm to 1000 nm. Their low predicted uncerta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916505

4. Standoff passive video imaging at 350 GHz with 251 superconducting detectors
Topic: Optical Technology
Published: 6/20/2014
Authors: Daniel Thomas Becker, James A Beall, Hsiao-Mei Cho, Gene C Hilton, Nicholas G Paulter Jr., Carl D Reintsema, Robert E Schwall, Cale Gentry, Ilya Smirnov, Peter Ade, W D Duncan, Mark Halpern, Carole Tucker
Abstract: Millimeter wavelength radiation holds promise for detection of security threats at a distance, including suicide bomb belts and maritime threats in poor weather. The high sensitivity of superconducting Transition Edge Sensor (TES) detectors makes the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916162

5. Development of in-situ calibration method for current-to-voltage converters for high-accuracy SI-traceable low-DC-current measurements
Topic: Optical Technology
Published: 9/20/2013
Authors: George P Eppeldauer, Howard W Yoon, Dean G Jarrett, Thomas C Larason
Abstract: For photocurrent measurements with low uncertainties, wide-dynamic range reference current-to-voltage converters and a new converter calibration method have been developed at the National Institute of Standards and Technology (NIST). The high feedba ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914149

6. Harnessing 3D Scattered Optical Fields for sub-20 nm Defect Detection
Topic: Optical Technology
Published: 6/24/2013
Authors: Bryan M Barnes, Martin Y Sohn, Francois R. Goasmat, Hui Zhou, Richard M Silver, Abraham Arceo
Abstract: Experimental imaging at =193 nm of sub-resolved defects performed at several focus positions yields a volume of spatial and intensity data. Defects are located in a differential volume, given a reference, with up to 5x increase in sensitivity ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913510

7. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Technology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913528

8. Chapter 13. Color Quality of White LEDs
Topic: Optical Technology
Published: 5/24/2013
Author: Yoshihiro Ohno
Abstract: This chapter overviews the fundamentals of chromaticity and color rendering as the two important aspects of color quality of light sources for general illumination, with special focus on the use for solid state light sources. The section for chrom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912950

9. Metrology for Lab-on-a-Chip Final-Product Devices
Topic: Optical Technology
Published: 5/12/2013
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: New metrology tools to measure the critical parameters of internal structures in lab on a chip devices are greatly needed in order to develop standard tests for this technology. Here we present a method that combines a custom made optical coherence ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913496

10. Random testing reveals excessive power in commercial laser pointers
Topic: Optical Technology
Published: 5/1/2013
Authors: Joshua Aram Hadler, Edna L Tobares, Marla L Dowell
Abstract: In random testing of 122 commercial laser pointers, we observed that 89.7 % of green pointers and 44.4 % of red pointers were not in compliance with the Code of Federal Regulations, producing laser power in excess of the Accessible Emission Limit at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912603



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