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You searched on: Author: David Kuhn

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1. Introducing Combinatorial Testing to a Large System-Software Organization
Published: 4/23/2015
Authors: Jon Hagar, Thomas Wissink, David R Kuhn, Raghu N Kacker
Abstract: This paper examines the introduction of combinatorial testing into a large aerospace corporation. It describes factors that were considered in introducing combinatorial testing, results with respect to cost and effectiveness, lessons learned, and re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913242

2. Combinatorial Coverage as an Aspect of Test Quality
Published: 3/31/2015
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Abstract There are relatively few good methods for evaluating test set quality, after ensuring basic requirements traceability. Structural coverage, mutation testing, and related methods can be used if source code is available, but these approaches ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917352

3. IT Security
Published: 2/4/2015
Authors: Morris Chang, David R Kuhn, Timothy Weil
Abstract: This is an editors introduction to a special issue on security, IEEE IT Professional.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917217

4. IT Pro Conference on Information Systems Governance
Published: 8/6/2014
Authors: Irena Bojanova, David R Kuhn
Abstract: Approximately 100 IT professionals participated in the 2014 IT Pro Conference on Information Systems Governance, held at the National Institute of Standards and Technology (NIST) on May 22, 2014 (www.computer.org/itproconf). Information systems gover ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916238

5. An Empirical Comparison of Combinatorial and Random Testing
Published: 4/4/2014
Authors: Raghu N Kacker, David R Kuhn
Abstract: Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915578

6. An Empirical Comparison of Combinatorial and Random Testing
Published: 4/1/2014
Authors: Laleh Ghandehari, Jacek Czerwonka, Yu Lei, Soheil Shafiee, Raghu N Kacker, David R Kuhn
Abstract: Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915439

7. Estimating Fault Detection Effectiveness
Published: 4/1/2014
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: [Poster] A t-way covering array can detect t-way faults, however they generally include other combinations beyond t-way as well. For example, a particular test set of all 5-way combinations is shown capable of detecting all seeded faults in a test pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915440

8. Introducing Combinatorial Testing in a Large Organization: Pilot Project Experience Report
Published: 4/1/2014
Authors: Jon Hagar, David R Kuhn, Raghu N Kacker, Thomas Wissink
Abstract: This poster gives an overview of the experience of eight pilot projects, over two years, applying combinatorial testing in a large aerospace organization. While results varied across the different pilot projects, overall it was estimated that CT wou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915302

9. IT Risks
Published: 2/3/2014
Authors: Linda Wilbanks, David R Kuhn, Wes Chou
Abstract: Risk management is a common phrase when managing information, from the CISO to the programmer. We acknowledge that risk management is the identification, assessment and prioritization of risks and reflects how we manage uncertainty. These are some a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915277

10. Software Testing - Guest Editor Introduction
Published: 2/3/2014
Authors: Renee Bryce, David R Kuhn
Abstract: This special issue presents papers that focus on important problems within the Software Testing community.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915353



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