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Author: Raymond Santoyo

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1. Evaluation of Bias for Two Charpy Impact Machines Using the Same Instrumented Striker
Published: 5/1/2011
Authors: Christopher N McCowan, Enrico Lucon, Raymond L Santoyo
Abstract: Two Charpy machines were used to test NIST verification specimens at three energy levels: low energy (≈ 15 J at -40°C), high energy (≈ 100 J at -40°C) and super-high energy (≈ 240 J at room temperature). The study evaluates the diff ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905891

2. Effect of CVN Striker Radius on Absorbed Energy and Lateral Expansion for Various Stainless Steels
Published: 11/1/2006
Authors: Thomas Allen Siewert, Betsy Siewert, Raymond L Santoyo
Abstract: A number of wrought and cast stainless steel alloys were used to evaluate the effect of Charpy V-notch striker radius (2 mm vs 8 mm). Standard 10 mm by 10 mm (and 5 mm by 10 mm for N06022) specimens were machined from 5 grades of wrought material (30 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50378

3. Evaluation Specimens for Izod Impact Machines (SRM 2115): Report of Analysis
Series: Special Publication (NIST SP)
Report Number: 260-164
Published: 10/1/2006
Authors: Thomas Allen Siewert, Jolene D Splett, Raymond L Santoyo
Abstract: In the past few years, we have received a number of requests for verification specimens for Izod impact machines, similar to what we offer for Charpy impact machines. Although there are similarities between Izod and Charpy impact testing, there are s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50301

4. Failure Analysis of the WWVB Tower
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6619
Published: 8/1/2002
Authors: Joseph David McColskey, Christopher N McCowan, Raymond L Santoyo
Abstract: A failure analysis was conducted on the collapse of the NIST WWVB tower. The analysis included mechanical testing, chemical analysis, and metallographic examination of the failed part. We ascertained that the underlying reason for the collapse was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851247



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