You searched on: Author: Roy Geiss
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1. Temperature-dependent structure of Tb-doped magnetite nanoparticles
Katherine P. Rice, Stephen E Russek, Roy H. Geiss, Justin M Shaw, Robert J. Usselman, Eric Raymond Evarts, Thomas J Silva, Hans Toya Nembach, Elke Arenholz, Yves U. Idzerda
High quality 5 nm cubic Tb-doped magnetite nanoparticles have been synthesized by a modified wet-chemical method to investigate tailoring of magnetic properties for imaging and biomedical applications. We show that the Tb is incorporated into the oct ...
2. ATMP-Stabilized Iron Nanoparticles: Chelator-Controlled Nanoparticle Synthesis
Lauren F. Greenlee, Nikki S Rentz, Roy H. Geiss
Iron nanoparticles are of interest in fields such as water treatment and alternative energy due to
their reactive properties and low cost. When combined with other metals, iron-metal nanoparticles
can act as catalysts for a diverse set of reacti ...
3. Characterization of InGaN quantum disks in GaN nanowires
Alexana Roshko, Roy H. Geiss, John B. Schlager, Matthew David Brubaker, Kristine A Bertness, Norman A Sanford, Todd E Harvey
Catalyst-free GaN nanowires with InGaN quantum disks (QDs) were characterized by scanning/transmission elec-tron microscopy (S/TEM) and photoluminescence. A va-riety of structures, from QDs with large strain fields to apparently strain free QDs were ...
4. Transmission EBSD in the Scanning Electron Microscope
Roy H. Geiss, Katherine P. Rice, Robert R Keller
A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight m ...
5. Transmission EBSD-Like Patterns in the SEM for Nanoparticle and Ultrathin Film Analysis
Robert R Keller, Roy H. Geiss
We describe a new high-resolution scanning electron microscope method for measuring crystallographic information in nanoparticles and ultrathin films with dimensions down to 10 nm, through use of an electron backscatter diffraction (EBSD) detector. B ...
6. Effects of barrier composition and electroplating chemistry on adhesion and voiding in copper/dielectric diffusion barrier films
Ryan Paul Birringer, Roey Shaviv, Roy H. Geiss, David Thomas Read, Reinhold Dauskardt
The effects of electroplating chemistry and dielectric diffusion barrier
composition on Cu voiding and barrier adhesion are reported. Adhesion was quantified
using the four-point bend thin film adhesion technique, and voiding in the Cu films was
7. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Jason Philip Killgore, Roy H. Geiss, Donna C. Hurley
Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
8. Methods for TEM analysis of NIST‰s SWCNT SRM
Roy H. Geiss, Elisabeth Mansfield, Jeffrey A Fagan
The National Institute of Standards and Technology (NIST) is developing a series of single-walled carbon nanotube, SWCNT, reference materials, RMs, to provide researchers with well characterized materials for their applications. The SWCNT reference m ...
9. Resistivity Dominated by Surface Scattering in Sub-50 nm Cu Wires
Rebekah L. Graham, Glenn Alers, Thomas Mountsier, N. Shamma, S. Dhuey, R. H. Cabrini, Roy H. Geiss, David Thomas Read, S. Peddeti
The electron scattering mechanisms in sub-50nm copper lines were
investigated to understand the extendibility of copper interconnects when the line width
or thickness is less than the mean free path. Electron-beam lithography and a dual hardmask
10. Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Ward L Johnson, Sudook A. Kim, Roy H. Geiss, Colm Flannery, Paul R Heyliger, Christopher L Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M Stafford, B D. Vogt
Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these ...