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You searched on: Author: Roy Geiss

Displaying records 1 to 10 of 50 records.
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1. Temperature-dependent structure of Tb-doped magnetite nanoparticles
Published: 2/13/2015
Authors: Katherine P. Rice, Stephen E Russek, Roy H. Geiss, Justin M Shaw, Robert J. Usselman, Eric Raymond Evarts, Thomas J Silva, Hans Toya Nembach, Elke Arenholz, Yves U. Idzerda
Abstract: High quality 5 nm cubic Tb-doped magnetite nanoparticles have been synthesized by a modified wet-chemical method to investigate tailoring of magnetic properties for imaging and biomedical applications. We show that the Tb is incorporated into the ...

2. ATMP-Stabilized Iron Nanoparticles: Chelator-Controlled Nanoparticle Synthesis
Published: 11/1/2014
Authors: Lauren F. Greenlee, Nikki S Rentz, Roy H. Geiss
Abstract: Iron nanoparticles are of interest in fields such as water treatment and alternative energy due to their reactive properties and low cost. When combined with other metals, iron-metal nanoparticles can act as catalysts for a diverse set of reacti ...

3. Characterization of InGaN quantum disks in GaN nanowires
Published: 3/4/2014
Authors: Alexana Roshko, Roy H. Geiss, John B. Schlager, Matthew David Brubaker, Kristine A Bertness, Norman A Sanford, Todd E Harvey
Abstract: Catalyst-free GaN nanowires with InGaN quantum disks (QDs) were characterized by scanning/transmission elec-tron microscopy (S/TEM) and photoluminescence. A va-riety of structures, from QDs with large strain fields to apparently strain free QDs were ...

4. New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD
Published: 10/9/2013
Authors: Roy H. Geiss, Robert R Keller, Katherine P. Rice
Abstract: The technique of acquiring transmission electron diffraction patterns in the scanning electron microscope, SEM, using components of commercially available electron backscattered diffraction equipment, EBSD, normally used in a reflection geometry, was ...

5. Transmission EBSD in the Scanning Electron Microscope
Published: 5/1/2013
Authors: Roy H. Geiss, Katherine P. Rice, Robert R Keller
Abstract: A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight m ...

6. Vibrational modes of GaN nanowires in the gigahertz range
Published: 11/13/2012
Authors: Ward L Johnson, Sudook A. Kim, Roy H. Geiss, Colm Flannery, Kristine A Bertness, Paul R Heyliger
Abstract: Monocrystalline nanowires offer an attractive basis for resonant nanoelectromechanical systems (NEMS) for a variety of applications, including mass and force sensing, and, in each of these applications, there are advantages to operation at frequenci ...

7. Tunable glass reference materials for quantitative backscattered electron imaging of mineralized tissues
Published: 8/21/2012
Authors: Sara E. Campbell, Roy H. Geiss, Steve A Feller, Virginia L. Ferguson
Abstract: Backscatter electron (BSE) microscopy provides graylevel contrast resulting from variations in atomic composition. Through the use of standards, quantitative BSE imaging can be used to measure the mineral content of mineralized tissues such as bo ...

8. Transmission EBSD-Like Patterns in the SEM for Nanoparticle and Ultrathin Film Analysis
Published: 3/1/2012
Authors: Robert R Keller, Roy H. Geiss
Abstract: We describe a new high-resolution scanning electron microscope method for measuring crystallographic information in nanoparticles and ultrathin films with dimensions down to 10 nm, through use of an electron backscatter diffraction (EBSD) detector. B ...

9. Effects of barrier composition and electroplating chemistry on adhesion and voiding in copper/dielectric diffusion barrier films
Published: 8/15/2011
Authors: Ryan Paul Birringer, Roey Shaviv, Roy H. Geiss, David Thomas Read, Reinhold Dauskardt
Abstract: The effects of electroplating chemistry and dielectric diffusion barrier composition on Cu voiding and barrier adhesion are reported. Adhesion was quantified using the four-point bend thin film adhesion technique, and voiding in the Cu films was q ...

10. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy H. Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...

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  • SP 250-XX: Calibration Services
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