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Author: Roy Geiss

Displaying records 1 to 10 of 38 records.
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1. Characterization of InGaN quantum disks in GaN nanowires
Published: 3/4/2014
Authors: Alexana Roshko, Roy Howard Geiss, John B Schlager, Matthew David Brubaker, Kristine A Bertness, Norman A Sanford, Todd E Harvey
Abstract: Catalyst-free GaN nanowires with InGaN quantum disks (QDs) were characterized by scanning/transmission elec-tron microscopy (S/TEM) and photoluminescence. A va-riety of structures, from QDs with large strain fields to apparently strain free QDs were ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914871

2. Transmission EBSD in the Scanning Electron Microscope
Published: 5/1/2013
Authors: Roy Howard Geiss, Katherine P Rice, Robert R Keller
Abstract: A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912886

3. Transmission EBSD-Like Patterns in the SEM for Nanoparticle and Ultrathin Film Analysis
Published: 3/1/2012
Authors: Robert R Keller, Roy Howard Geiss
Abstract: We describe a new high-resolution scanning electron microscope method for measuring crystallographic information in nanoparticles and ultrathin films with dimensions down to 10 nm, through use of an electron backscatter diffraction (EBSD) detector. B ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907049

4. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907208

5. Methods for TEM analysis of NIST‰s SWCNT SRM
Published: 3/25/2010
Authors: Roy Howard Geiss, Elisabeth Mansfield, Jeffrey A Fagan
Abstract: The National Institute of Standards and Technology (NIST) is developing a series of single-walled carbon nanotube, SWCNT, reference materials, RMs, to provide researchers with well characterized materials for their applications. The SWCNT reference m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905078

6. Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Published: 1/18/2010
Authors: Ward L Johnson, Sudook A Kim, Roy Howard Geiss, Colm Flannery, Paul R Heyliger, Christopher Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M Stafford, B D. Vogt
Abstract: Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903959

7. Transmission Electron Diffraction from nanoparticles, nanowires and thin films in an SEM using conventional EBSD equipment
Published: 1/1/2010
Authors: Roy Howard Geiss, Robert R Keller, David Thomas Read
Abstract: We describe a new scanning electron microscope (SEM) method for obtaining and analyzing the crystallographic structure and orientation in nanoparticles and ultrathin films using conventional electron backscatter diffraction (EBSD) equipment.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905080

8. Effect of microstructure on magnetic properties and anisotropy distributions in Co/Pd thin films and nanostructures
Published: 11/19/2009
Authors: Justin M Shaw, Hans T. Nembach, Thomas J Silva, Stephen E Russek, Roy Howard Geiss
Abstract: The structure of Co/Pd multilayers has a strong effect on the localized anisotropy distribution within a film and the resulting switching properties of nanostructures fabricated from identical material. By varying the underlying seed layer, the micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903594

9. Methods for TEM analysis of NIST s single-walled carbon nanotube Standard Reference Material
Published: 8/20/2009
Authors: Elisabeth Mansfield, Roy Howard Geiss, Jeffrey A Fagan
Abstract: The National Institute of Standards and Technology (NIST) is releasing a series of single-walled carbon nanotube Standard Reference Materials (SRMs) to provide consumers with a well-characterized material for their applications. The SWCNT Reference ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903069

10. Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires
Published: 4/1/2009
Authors: Roy Howard Geiss, David Thomas Read
Abstract: GaN nanowires with InGaN quantum wells (QW) were grown on heated Si(111) substrates by molecular beam epitaxy (MBE) using elemental Ga and In and a radio-frequency-plasma N2 source. The growth procedures and the morphology of these nanowires have bee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902327



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