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You searched on: Author: Robert Cook

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1. Fracture strength of micro- and nano-scale silicon components
Published: 5/13/2015
Authors: Frank W DelRio, Robert Francis Cook, Brad Boyce
Abstract: Silicon devices are ubiquitous in many micro- and nano-scale technological applications, most notably microelectronics and microelectromechanical systems (MEMS). Despite their widespread usage, however, issues related to uncertain mechanical reliabi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917944

2. In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films
Published: 2/14/2015
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman imaging of the deformed contact region of silicon, employing a Raman spectroscopy-enhanced instrumented indentation technique. This is, to our knowledge, the first seque ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916253

3. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao M. Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

4. Raman spectroscopy-enhanced IIT: In situ analysis of mechanically stressed polycrystalline Si thin films
Published: 7/8/2014
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Robert Francis Cook
Abstract: Exposed to mechanical stress, semiconductor materials may phase transform, resulting in changes of crystallographic structure and material properties, rather than deform by plastic flow. As a consequence, prediction of the state and distribution of s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915665

5. Stress mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy
Published: 6/15/2014
Authors: Grant A Myers, Siddharth Hazra, Maarten de Boer, Chris A Michaels, Stephan J Stranick, Ryan P. Koseski, Robert Francis Cook, Frank W DelRio
Abstract: Stress mapping of micromachined polycrystalline silicon devices with components in various levels of uniaxial tension was performed. Confocal Raman microscopy was used to form two-dimensional maps of Raman spectral shifts, which exhibited variations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915909

6. Accurate Spring Constant Calibration for very Stiff Atomic Force Microscopy Cantilevers
Published: 11/26/2013
Authors: Scott Grutzik, Richard Swift Gates, Yvonne Beatrice Gerbig, Douglas T Smith, Robert Francis Cook, Alan Zehnder
Abstract: There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912481

7. Frictional properties of native and functionalized type I collagen thin films
Published: 10/2/2013
Authors: Koo-hyun Chung, Antony Chen, Christopher Anderton, Kiran Bhadriraju, Anne L Plant, Brian G Bush, Robert Francis Cook, Frank W DelRio
Abstract: Frictional properties of native and fibronectin (FN)-functionalized type I collagen (COL) thin films were studied via atomic force microscopy. The COL lateral contact stiffness was dependent only on the hydration state, indicating that shear deformat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914307

8. Decoupling small-scale roughness and long-range features on deep reactive ion etched silicon surfaces
Published: 9/19/2013
Authors: Frank W DelRio, Lawrence H Friedman, Michael S. Gaither, William A Osborn, Robert Francis Cook
Abstract: Roughness scaling of three different deep reactive ion etched (DRIE) silicon surfaces is investigated using atomic force microscopy. At small distances, height-height correlations H reveal power-law behavior with equal scaling exponents for all surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913812

9. Development of a Precision Nanoindentation Platform
Published: 7/18/2013
Authors: Douglas T Smith, Bartosz Karol Nowakowski, Robert Francis Cook, Stuart T Smith, Luis F Correa
Abstract: This paper presents the design, construction and performance of a surface- referenced nanoindentation instrument termed a precision nanoindentation platform (PNP). The PNP is a symmetrically designed instrument with a centrally located indenter tip a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912510

10. On the bending strength of single-crystal silicon theta-like specimens
Published: 7/10/2013
Authors: Rebecca R. Kirkpatrick, William A Osborn, Michael S. Gaither, Richard Swift Gates, Frank W DelRio, Robert Francis Cook
Abstract: A new theta geometry was developed for micro-scale bending strength measurements. The new ,gapŠ theta specimen was a simple modification of the arch theta specimen that enabled micro-scale tensile testing. The gap theta was demonstrated here on sin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913369



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  • SP 250-XX: Calibration Services
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