NIST logo

Publications Portal

You searched on:
Author: John Bonevich

Displaying records 1 to 10 of 68 records.
Resort by: Date / Title


1. Surface mediated assembly of small, metastable gold nanoclusters
Published: 5/27/2013
Authors: John M Pettibone, William A Osborn, Konrad Rykaczewski, Albert A. Talin, John E Bonevich, Jeffrey W Hudgens
Abstract: The unique properties of metallic nanoclusters are attractive for numerous commercial and industrial applications but are generally less stable than nanocrystals. Thus, developing methodologies for stabilizing nanoclusters and retaining their enhance ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909387

2. Topological Insulator Bi2Se3 Nanowire High Performance Field-Effect Transistors
Published: 4/30/2013
Authors: Hao Zhu, Curt A Richter, Erhai Zhao, John E Bonevich, William Andrew Kimes, Hyuk-Jae Jang, Hui Yuan, Abbas Arab, Oleg A Kirillov, James E Maslar, D. E Ioannou, Qiliang Li
Abstract: Topological insulators are unique electronic materials with insulating interiors but robust metallic surfaces. Device applications exploiting their remarkable properties, such as surface conduction of helical Dirac electrons, have so far been hampere ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912994

3. Large-Area GaN n-p Core-Shell Arrays Fabricated Using Top-Down Etching and Selective Epitaxial Overgrowth
Published: 12/10/2012
Authors: Abhishek Motayed, Sergiy Krylyuk, Dipak Paramanik, Matt NMN King, Jong Yoon Ha, Albert Davydov, John E Bonevich
Abstract: We present large-area, vertically-aligned GaN core-shell structures on silicon substrates. The GaN cores were formed by inductively coupled plasma etching of patterned n-type GaN epitaxial layer. The Mg-doped GaN shells were formed using selective ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911851

4. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Published: 3/9/2012
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, John E Bonevich, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this program, and the focus of this paper, is the use of critical dimension atomic force ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908943

5. Development of a Seebeck Coefficient Standard Reference Material (SRM),
Published: 8/1/2011
Authors: Nathan Lowhorn, Winnie K Wong-Ng, John Lu, Joshua Brooks Martin, Martin L Green, John E Bonevich, Evan L. Thomas, Neil Dilley, Jeff Sharp
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM,), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential stea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907792

6. One-dimensional p-n heterojunctions of zinc oxide on gallium nitride: A structural characterization
Published: 7/1/2011
Authors: Babak Nikoobakht, John E Bonevich, Andrew A Herzing
Abstract: Recently we showed lateral growth of ZnO nanowires and nanowalls on single crystal GaN and formation of bi- and tri-directional assembly of nanowires and nanowalls using a surface-directed vapor-liquid-solid process (SVLS). Taking advantage of this ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907758

7. Fabrication, Characterization and Simulation of High Performance Si Nanowire-based Non-Volatile Memory Cells
Published: 5/16/2011
Authors: Xiaoxiao Zhu, Qiliang Li, D. E Ioannou, Diefeng Gu, John E Bonevich, Helmut Baumgart, John S Suehle, Curt A Richter
Abstract: We report the fabrication, characterization and simulation of Si nanowire SONOS-like non-volatile memory with HfO2 charge trapping layers of varying thickness. The memory cells, which are fabricated by self-aligning in-situ grown Si nanowires, exhibi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907251

8. Electrodeposition of Pt_(100-x)Pb_(x) Metastable Alloys and Intermetallics
Published: 4/4/2011
Authors: Sun M. Hwang, John E Bonevich, Jae Jeong Kim, Thomas P Moffat
Abstract: The electrodeposition of a series of metastable Pt-Pb alloys and intermetallic phases as well as elemental Pt is demonstrated using an acid electrolyte comprised of 0.05 mol/L Pb(ClO_4)_2 and/or 0.001 mol/L K_2PtCl_4. Pt-Pb films were deposited at va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907677

9. Formic acid oxidation on Pt_{100-x}Pb_{x} thin films electrodeposited on Au
Published: 4/4/2011
Authors: Sun M. Hwang, John E Bonevich, Jae Jeong Kim, Thomas P Moffat
Abstract: Electrocatalytic formic acid oxidation is examined on electrodeposited Pt_{100-x}Pb_{x} thin films grown on textured Au(111). Metastable fcc Pb_{100-x}Pt_{x} (0 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907874

10. Superconformal Ni Electrodeposition using 2-Mercaptobenzimidazole
Published: 4/4/2011
Authors: Chang H. Lee, John E Bonevich, Ugo Bertocci, Kristen L Steffens, Thomas P Moffat
Abstract: Ni superconformal filling of sub-micrometer trenches is demonstrated using a Watts bath containing an inhibitor 2-mercaptobenzimidazole (MBI). Hysteretic voltammetry marks the breakdown of the MBI-induced passive-state coincident with the onset of Ni ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907684



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series