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Author: Bruce Ravel

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1. Diamond Sensors and Polycapillary Lenses for X-ray Absorption Spectroscopy
Published: 10/13/2013
Author: Bruce D Ravel
Abstract: Diamond sensors are evaluated as incident beam monitors for X-ray Absorption Spectroscopy experiments. These single crystal devices pose a challenge for an energyscanning experiment using hard X-rays due to the e ect of diffraction from the crystalli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913887

2. EXAFS Studies of Catalytic DNA Sensors for Mercury Contamination of Water
Published: 12/11/2009
Authors: Bruce D Ravel, S.C. Slimmer, X. Meng, G.C.L. Wong, Y. Lu
Abstract: Monitoring of metallic contaminants in domestic and agricultural water systems systems requires technology that is fast, flexible, sensitive, and selective. Recently, metal sensors based on catalytic DNA have been demonstrated as a practical monitor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854469

3. Condensed Matter Astrophysics A Prescription for Determining the Species-Specific Composition and Quantity of Interstellar Dust using X-rays
Published: 9/10/2009
Authors: Bruce D Ravel, Julia C. Lee, Jingen Xiang, Jeffrey Kortright, Kathryn Flanagan
Abstract: We present a new technique for determining the quantity and composition of dust in astrophysical environments using < 6 keV X-rays. We argue that high resolution X-ray spectra as enabled by the Chandra and XMM-Newton gratings should be considered ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903572

4. Pentavalent Uranium Oxide via Reduction of [UO^d2^]^u2+^ Under Hydrothermal Reaction Conditions
Published: 5/23/2008
Authors: Nebebech Belai, Mark Frisch, Eugene Ilton, Bruce D Ravel, Christopher Cahill
Abstract: The synthesis, crystal structure and spectroscopic characterization of [UV(H2O)2(UVIO2)2O4(OH)](H2O)4, a mixed-valent UV/UVI oxide material, are reported. The hydrothermal reaction of UO22+ with Zn and hydrazine at 120 °C for three days yields 1 in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854092

5. Surface Structure and Orientation of PTFE Films Determined by Experimental and FEFF8-Calculated NEXAFS Spectra
Published: 3/1/2002
Authors: L Gamble, Bruce D Ravel, Daniel A Fischer, David G. Castner
Abstract: Near edge X-ray absorption fine structure (NEXAFS) experiments have provided information about the orientation of adsorbed small molecules, self-assembled monolayers, and polymers. Long fluorocarbon chains are known to have a twisted (or helical) st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850579

6. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

7. Tomography of Integrated Circuit Interconnect With an Electromigration Void
Published: 5/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840087

8. Combined EXAFS and First-Principles Theory Study of Pb^d1-x^Ge^dx^Te
Published: 12/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, E Newville, K M Rabe
Abstract: The narrow band-gap semiconductor Pb^d1-x^Ge^dx^Te has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rocksalt structure. We have measured the Extended X-Ray-Absorption Fine-Structure (EXAFS) spectra of Pb^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850304

9. X-Ray-Absorption Edge Separation Using Diffraction Anomalous Fine-Structure
Published: 7/1/1999
Authors: Bruce D Ravel, Charles E. Bouldin, H Renevier, J -L Hodeau, J -F Berar
Abstract: When two or more absorption edges in a material are sufficiently close in energy, Extended X-ray-Absorption Fine-Structure (EXAFS) spectroscopy may be of limited utility as the usable data range above the lower energy edge is truncated by the presenc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850292

10. The Local Structure of Ferroelectric Pb^d1-x^Ge^dx^Te
Published: 5/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, K M Rabe
Abstract: The narrow band-gap semiconductor Pb_{1-x}Ge_xTe has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rock salt structure. We have measured the Extended X-ray-Absorption Fine-Structure spectra of Pb_{1-x}Ge_x ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850297



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