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Author: Christine Mahoney

Displaying records 1 to 10 of 23 records.
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1. Investigation of damage mechanisms in PMMA during ToF-SIMS depth profiling with 5 keV and 8 keV SF5+ primary ions.
Published: 9/2/2010
Authors: Christine M. Mahoney, James G. Kushmerick, Kristen L Steffens
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) has been proven to be a useful technique for the surface and in-depth characterization of molecular films. Here, an SF5+ polyatomic primary ion source is utilized for depth profiling in poly(met ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904766

2. Characterization of C-4 Samples using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Published: 9/1/2010
Authors: Christine M. Mahoney, Albert J. Fahey, Kristen L Steffens, Richard T. Lareau
Abstract: The application of surface analytical techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), and X-ray Photoelectron Spectroscopy (XPS) are explored as a means of differentiating between C-4 samples. Three different C-4 sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902580

3. Fluorinated Copolymer Nanoparticles for Multimodal Imaging Applications
Published: 2/18/2010
Authors: Mark M. Bailey, Christine M. Mahoney, Elodie Dempah, Jeffrey M Davis, Matthew Becker, Supang Khondee, Eric J. Munson, Cory J. Berkland
Abstract: Nanomaterials have emerged as valuable tools in biomedical imaging techniques, such as magnetic resonance imaging (MRI), fluorescence, positron emission tomography (PET), and others. Some have been designed to serve as multimodal imaging agents, com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902813

4. Chemical Imaging of Drug Eluting Coatings: Combining Surface Analysis and Confocal Raman Microscopy
Published: 3/1/2008
Authors: A M Belu, Christine M. Mahoney, Klaus Wormuth
Abstract: Chemical images of the surfaces and the interiors of coatings of rapamycin in poly(lactic-co-glycolic acid) (PLGA) obtained by mass spectrometry and light scattering methods reveal a three dimensional picture of the chemical morphology of drug elutin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831449

5. 3-Dimensional Compositional Analysis in Drug Eluting Stent (DES) Coatings Using Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)
Published: 2/1/2008
Authors: Christine M. Mahoney, A M Belu, Albert J. Fahey
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) employing an SF5+ polyatomic primary ion sputter source in conjunction with a Bi3+ analysis source was used to obtain 3-dimensional molecular information in polymeric-based drug eluting stent (DE ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831450

6. Interfacial Modification of Silica Surfaces through Gamma-Isocyanatopropyl Triethoxy Silane {?} Amine Coupling Reactions
Published: 1/15/2008
Authors: Brandon M. Vogel, Dean M DeLongchamp, Christine M. Mahoney, Leah A. Lucas, Daniel A Fischer, Eric K Lin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854340

7. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

8. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

9. 3D Molecular Imaging SIMS
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393

10. Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS)
Published: 7/1/2006
Authors: Christine M. Mahoney, Martin McDermott
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was utilized to analyze several materials commonly used in drug eluting stents (DES). Poly(ethylene-co-vinyl acetate) (PEVA), Poly(lactic-co-glycolic acid) (PLGA) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831403



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