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Author: R Verkouteren

Displaying records 1 to 10 of 23 records.
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1. Inkjet Metrology II: Resolved Effects of Ejection Frequency, Fluidic Pressure and Droplet Number on Reproducible Drop-on-Demand Dispensing
Published: 6/13/2011
Authors: R Michael Verkouteren, Jennifer R Verkouteren
Abstract: We report highly reproducible gravimetric and optical measurements of microdroplets enabled by fluidic pressure feedback control and state-of-the-art measurement systems that lend new insights into the process of drop-on-demand (DOD) printing. Baseli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908095

2. Inkjet Metrology: High-Accuracy Mass Measurements of Microdrops Produced by a Drop-on-Demand Dispenser
Published: 10/15/2009
Authors: R Michael Verkouteren, Jennifer R Verkouteren
Abstract: We describe three gravimetric methods for accurately measuring the mass of picoliter-sized fluid droplets generated by a piezoelectric drop-on-demand (DOD) dispenser. Optical methods are also described for co-measurement of droplet diameters. Droplet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902402

3. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831432

4. Inkjet Metrology and Standards for Ion Mobility Spectrometry
Published: 9/1/2007
Authors: R Michael Verkouteren, J Brazin, Eric S Windsor, Robert A Fletcher, R Maditz, Wayne Smith, John G Gillen
Abstract: Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831425

5. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901934

6. After Two Decades a Second Anchor for the VPDB delta-13-C Scale
Published: 11/15/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901931

7. Piezoelectric Trace Vapor Calibrator
Published: 8/1/2006
Authors: R Michael Verkouteren, John G Gillen, David Taylor
Abstract: The design and performance of a vapor generator for calibration and testing of trace chemical sensors are described. The device utilizes piezoelectric nozzles to dispense and vaporize precisely known amounts of analytic solutions onto a hot ceramic s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831411

8. New Guidelines for delta-13-C Measurements
Published: 4/1/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901932

9. Consistency of Delta ^u13^ C Measurements Improved
Published: 2/1/2006
Authors: T B Copelen, W Brand, M Gehre, M Groening, HAJ Meijer, Blaza Toman, R Michael Verkouteren
Abstract: We present state-of-the-art measurements and data evaluation methods to show that the consistency of carbon isotope ratio measurements can be improved 39 % to 47 % by anchoring the measurement scale with two isotopic reference materials differing in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831406

10. Consistency of Delta ^u13^ C Measurements Improved
Published: 2/1/2006
Authors: Blaza Toman, T Coplen, W Brand, R Michael Verkouteren, M Gehre, M Groening, HAJ Meijer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901072



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