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Author: Albert Fahey

Displaying records 1 to 10 of 27 records.
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1. Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence
Published: 6/1/2011
Authors: Jeffrey M Davis, Dale E Newbury, Nicholas W m Ritchie, Edward P. Vicenzi, Dale P Bentz, Albert J. Fahey
Abstract: X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904216

2. Characterization of C-4 Samples using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Published: 9/1/2010
Authors: Christine M. Mahoney, Albert J. Fahey, Kristen L Steffens, Richard T. Lareau
Abstract: The application of surface analytical techniques such as Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), and X-ray Photoelectron Spectroscopy (XPS) are explored as a means of differentiating between C-4 samples. Three different C-4 sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902580

3. 3-Dimensional Compositional Analysis in Drug Eluting Stent (DES) Coatings Using Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)
Published: 2/1/2008
Authors: Christine M. Mahoney, A M Belu, Albert J. Fahey
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) employing an SF5+ polyatomic primary ion sputter source in conjunction with a Bi3+ analysis source was used to obtain 3-dimensional molecular information in polymeric-based drug eluting stent (DE ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831450

4. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

5. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

6. 3D Molecular Imaging SIMS
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393

7. Performance of a C^d60^+ Ion Source on a Dynamic SIMS Instrument
Published: 7/1/2006
Authors: Albert J. Fahey, John G Gillen, P Chi, Christine M. Mahoney
Abstract: An IonOptika [1] C60+ ion source has been fitted onto a CAMECA [1] ims-4f. Stable ion beams of C60+ and C602+ have been obtained with typical currents approaching 20 nA under conditions that allow for several days of source operation. The beam has ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831397

8. SIMS Depth Profiling of Polymer Blends With Protein Based Drugs
Published: 7/1/2006
Authors: Christine M. Mahoney, J Yu, Albert J. Fahey, J Gardella
Abstract: The use of SF5+ cluster ions for depth profiling has been successful for polymer-drug mixtures and polymer blends. This study reports results of the surface and in-depth characterization of two component blend films of poly(L-lactic acid) (PLLA) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831391

9. Temperature-Controlled Depth Profiling in Polymeric Biomaterials Using Cluster Secondary Ion Mass Spectrometry
Published: 7/1/2006
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, J Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile through various polymeric biomaterials at a series of temperatures from -125 oC to 150 oC. The depth profile characteristics (e.g. inte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831404

10. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923



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