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Author: Eric Windsor

Displaying records 1 to 10 of 19 records.
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1. A Computational and Experimental Investigation of Thermal Desorption and Vapor Sampling in an Explosive Trace Detector
Published: 6/30/2011
Authors: Matthew E Staymates, Wayne Smith, Eric S Windsor
Abstract: Swipe-based explosive trace detectors rely on thermal desorption to vaporize explosive particles collected on a swipe. The vaporized material is carried by air flows from the desorption unit to the inlet of the chemical analyzer, typically an ion mo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900937

2. Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis
Published: 10/15/2010
Authors: Eric S Windsor, Marcela Najarro Najarro, Anna N. Bloom, Bruce A Benner Jr, Robert A Fletcher, John G Gillen, Richard Lareau, Inho Cho, Mike Boldmand
Abstract: The feasibility of using piezoelectric drop-on-demand inkjet printing to prepare test materials for trace explosive analysis is demonstrated. Both pure high explosives and plastic-bonded putty explosives were formulated into inkjet printable solut ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902979

3. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831432

4. Inkjet Metrology and Standards for Ion Mobility Spectrometry
Published: 9/1/2007
Authors: R Michael Verkouteren, J Brazin, Eric S Windsor, Robert A Fletcher, R Maditz, Wayne Smith, John G Gillen
Abstract: Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831425

5. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901934

6. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831302

7. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277

8. Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction
Published: 9/1/2002
Authors: Jennifer R Verkouteren, Eric S Windsor, Joseph M Conny, R L Perkins, J T Ennis
Abstract: A simple ashing procedure is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the XRD pattern overlap between kaolinite and chrysotile that can interf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831245

9. SRM 482 Revisited After 30 Years
Published: 8/1/2001
Authors: Eric S Windsor, R Carlton, Scott A Wight, C Lyman
Abstract: The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831217

10. Silicon Oxynitride Film Thickness Measurements Using HRTEM and Grazing Incidence X-Ray Photoelectron Spectroscopy (GIXPS)
Published: 8/1/2000
Authors: J H J Scott, E Landree, Terrence J Jach, Eric S Windsor
Abstract: The ability to accurately and precisely measure the thickness of ultrathin ({proportional to} 3nm) dielectric films, used as gate dielectrics in integrated circuits, is critical to the continued success of the semiconductor manufacturing industry. U ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831174



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