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Author: John Small

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1. Microscopy and Microanalysis of Individual Collected Particles- Chapter 10
Published: 7/5/2011
Authors: Robert A Fletcher, Nicholas W m Ritchie, Ian M. Anderson, John A Small
Abstract: This chapter describes microscopy and microanalysis techniques used for the characterization of collected, individual particles in a variety of instruments. The instruments discussed are the light microscope, electron microscopes (both scanning and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901619

2. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C k Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900913

3. High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
Published: 3/21/2005
Authors: Dale E Newbury, J H J Scott, Scott A Wight, J T. Armstrong, John A Small
Abstract: Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831323

4. Electron Probe Microanalysis
Published: 1/1/2005
Authors: Dale E Newbury, Kent D Irwin, Gene C Hilton, David A Wollman, John A Small, John M. Martinis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32545

5. The Poly Plot Package - Data Analysis Tools for Spectral Images
Published: 8/1/2003
Authors: David S. Bright, John A Small
Abstract: One page abstract.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831294

6. A Proposal for a Standard Nomenclature and Interactive Database of Parameters and Correction Algorithms Used in Quantitative Electron Probe Microanalysis.
Published: 2/1/2003
Authors: J T. Armstrong, J H J Scott, John A Small, Eric B Steel
Abstract: One page abstract.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831293

7. A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems
Published: 12/31/2002
Authors: John A Small, Dale E Newbury, John Henry J. Scott, L. King, Sae Woo Nam, Kent D Irwin, Steven Deiker, Shaul Barkan, Jan Iwanczyk
Abstract: NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ({mu}cal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31341

8. A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems
Published: 12/1/2002
Authors: John A Small, Dale E Newbury, J H J Scott, L R King, Sae Woo Nam, Kent D Irwin, Steven Deiker, S Barkan, E Iwaniczko
Abstract: NIST, Gaithersburg has recently installed a first generation silicon drift dectector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ( cal-EDS) on a JEOL 840 SEM1 , as shown in Fig.1. [1,2] The ins ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831281

9. The Analysis of Particles at Low Accelerating Voltages (<= 10 kV) With Energy Dispersive X-Ray Spectroscopy (EDS)
Series: Journal of Research (NIST JRES)
Published: 11/1/2002
Author: John A Small
Abstract: In recent years, there have been a series of advancements in electron beam instruments and x-ray detectors which may make it possible to improve significantly the quality of results from the quantitative electron-probe analysis of individual particle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831279

10. The Development of Microcalorimeter EDS Arrays
Published: 11/1/2002
Authors: Kent D Irwin, James A Beall, Steven Deiker, Gene C Hilton, L. King, Sae Woo Nam, Dale E Newbury, Carl D Reintsema, John A Small, Leila R Vale
Abstract: High-energy-resolution cryogenic microcalorimeters are a powerful new tool for x-ray microanalysis. With demonstrated energy resolution ~20 times better than with conventional semiconductor EDS, microcalorimeters are useful in applications such as na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30025



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