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Author: Shirley Turner

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1. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C K Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900913

2. Restructuring of Tungsten Thin Films Into Nanowires and Hollow Square Cross-Section Microducts
Published: 11/1/2005
Authors: P. M. Parthangal, Richard E Cavicchi, Christopher B Montgomery, Shirley Turner, Michael Russel Zachariah
Abstract: We report on the growth of nanowires and unusual hollow microducts of tungsten by thermal treatment of tungsten films in a RF H2/Ar plasma at temperatures between 550-620 C. Nanowires with diameters of 10-30 nm and lengths between 50-300 nm were for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830917

3. A Microarray Approach for Optimizing Localized Deposition of Carbon Nanotubes Using Microhotplate Arrays
Published: 1/1/2004
Authors: C J Taylor, Richard E Cavicchi, Christopher B Montgomery, Shirley Turner
Abstract: A 340-element array of microhotplates is used to characterize the chemical vapor deposition growth of carbon nanotubes and nanofibers under a variety of process conditions. One dimension of the 17 by 20 element array was used to vary the thickness of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830827

4. Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis
Published: 9/1/2003
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831299

5. Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
Published: 8/1/2002
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Initial heterogeneity testing with the electron microprobe using WDS of three SiGe wafers cut from single-crystal boules of different concentrations (nominally 3.5, 6.5, and 14 atomic % Ge) is described. Random and repeat samplings over the entire s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831283

6. Characterization of the Morphology of Faceted Particles by Transmission Electron Microscopy
Published: 11/1/2001
Authors: Shirley Turner, David S. Bright
Abstract: Faceting in a polyhedral rutile particle was modeled from transmission electron microscopy images. A relatively new double-tilt, rotate transmission electron microscope (TEM) sample holder was used to manipulate the particle. Using this holder, it ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831246

7. Characterization of Voids in Rutile Nanoparticles by Transmission Electron Microscopy
Published: 11/1/2000
Author: Shirley Turner
Abstract: Rutile nanoparticles containing voids or cavities have been characterized using transmission electron microscopy. The general morphology of voids has been determined by obtaining images of particles in different orientations and by tilting nanoparti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831157

8. Transmission Electron Microscopy and Electron Holography of Nanophase TiO^d2^
Published: 4/4/1997
Authors: Shirley Turner, J E Bonevich, James E Maslar, M I Aquino, Michael Russel Zachariah
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100376

9. Characterization of Chemical Properties, Unit Cell Parameters and Particle Size Distribution of Three Zeolite Reference Materials: RM 8850 - Zeolite Y, RM 8851 - Linde Type A Zeolite and RM 8852 - Ammonium ZSM-5 Zeolite
Published: Date unknown
Authors: Shirley Turner, Robert A Fletcher, Eric S Windsor, Jennifer R Verkouteren, John R Sieber, Thomas W Vetter, Rolf Louis Zeisler, Anthony F Marlow, M E Davis, G J Kennedy, W S Borghard, S Yang, A Navrotsky, B H. Toby, James F Kelly, Stefan D Leigh
Abstract: Zeolites have important industrial applications including use as catalysts, molecular sieves and ion exchange materials. In this study, three zeolite materials have been characterized by the National Institute of Standards and Technology (NIST) as R ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831471

10. Electron Microprobe Characterization of Si-Ge Alloys and Films for Use as Microanalysis Reference Materials
Published: Date unknown
Authors: Ryna B. Marinenko, Shirley Turner, Dale E Newbury, Robert L. Myklebust, Lee Lijian Yu, Rolf Louis Zeisler, David S Simons, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and SiGe thick films on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference standards needed by the microelectronics ind ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831405



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