NIST logo

Publications Portal

You searched on: Author: Jay Hendricks

Displaying records 1 to 10 of 26 records.
Resort by: Date / Title


1. Comparison measurements of low-pressure between a laser refractometer and ultrasonic manometer
Published: 5/13/2016
Authors: Patrick F Egan, Jack A Stone Jr., Jacob E Ricker, Jay H Hendricks
Abstract: We have developed a new low-pressure sensor which is based on the measurement of (nitrogen) gas refractivity inside a Fabry-Perot (FP) cavity. We compare pressure determinations via this laser refractometer to that of well-established ultrasonic man ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920466

2. MEASURING PRESSURE AND VACUUM WITH LIGHT: A NEW PHOTONIC, QUANTUM-BASED, PRESSURE STANDARD
Published: 9/3/2015
Authors: Jay H Hendricks, Jacob E Ricker, Jack A Stone Jr., Patrick F Egan, Gregory E Scace, Gregory F Strouse, Douglas A Olson, Donavon Gerty
Abstract: The future of pressure and vacuum measurement will rely on lasers and Fabry-Perot optical cavities, and will be based on fundamental physics of light interacting with a gas. Light interacts at the quantum level with matter such that light travels at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918150

3. Performance of a dual Fabry-Perot cavity refractometer
Published: 8/18/2015
Authors: Patrick F Egan, Jack A Stone Jr., Jay H Hendricks, Jacob E Ricker, Gregory E Scace, Gregory F Strouse
Abstract: We have built and characterized a refractometer that utilizes two Fabry-Perot cavities formed on a dimensionally stable spacer. In the typical mode of operation, one cavity is held at vacuum and the other cavity is filled with nitrogen gas. The dif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918403

4. In Search of Better Pressure Standards
Published: 8/1/2014
Authors: Jay H Hendricks, Jacob E Ricker, Patrick F Egan, Gregory F Strouse
Abstract: Based on highly accurate optical interferometry and fundamental quantum calculations, researchers at the National Institute of Standards and Technology (NIST) in the US are developing an improved definition of the SI unit for pressure that will consi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916352

5. Metrology for comparison of displacements at the picometer level
Published: 7/31/2014
Authors: Jack A Stone Jr., Patrick F Egan, Jay H Hendricks, Gregory F Strouse, Douglas A Olson, Jacob E Ricker, Gregory E Scace, Donavon Gerty
Abstract: An apparatus capable of comparing displacements with picometer accuracy is currently being designed at NIST. In principle, we wish to compare one displacement in vacuum to a second, equal displacement in gas, in order to determine gas refractive inde ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914470

6. Recent advances in vacuum sciences and applications
Published: 4/9/2014
Authors: Miran Mozetic, Kostya Ostrikov, David Ruzic, Davide Curreli, Uros Cvelbar, Alenka Vesel, Gregor Primc, Manfred Leisch, Karl Jousten, Oleg Malyshev, Jay H Hendricks, laszlo Kover, Alberto Tagliaferro, O Conde, Antonio Silvestre, J Giapintzakis, M Buljan, N Radi?, G Dra?i?, S Bernstorff, H Biederman, O Kyli?n, J Hanu?, S Milo?evi?, A Galtayries, P Dietrich, W Unger, K Stana-Kleinschek, A Drmota?Petri?, J J Pireaux, J W Rogers, M Anderle, M Lehocky, V Sedlarik
Abstract: Recent advances in vacuum sciences and applications are reviewed. Novel optical interferometer cavity devices enable pressure measurements with ppm accuracy. Innovative dynamic vacuum standard allows for pressure measurements with temporal resolution ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914906

7. Picometer Metrology for Precise Measurement of Refractive Index, Pressure, and Temperature
Published: 12/18/2013
Authors: Jack A Stone Jr., Patrick F Egan, Donavon Gerty, Jay H Hendricks, Douglas A Olson, Jacob E Ricker, Gregory E Scace, Gregory F Strouse
Abstract: Fabry-Perot interferometers can be used for very precise measurement of the refractive index of gasses. This can enable increased accuracy of interferometer-based length measurement. In addition, because the refractive index of a gas depends on its ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914549

8. Picometer metrology for precise measurement of refractive index, pressure, and temperature
Published: 7/14/2013
Authors: Jack A Stone Jr., Patrick F Egan, Jay H Hendricks, Gregory F Strouse, Douglas A Olson, Jacob E Ricker, Gregory E Scace
Abstract: For several years we have been studying the use of Fabry-Perot interferometers for precise measurement of the refractive index of gasses, where the primary motivation has been to improve interferometer-based length measurement. Because the refractiv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913914

9. Faster, Better, Cheaper: New Automated Vacuum Calibration Service at NIST
Published: 10/1/2012
Authors: Jacob E Ricker, Jay H Hendricks, Douglas A Olson, Gregory F Strouse
Abstract: In today‰s fast-paced world and ever expanding quality assurance requirements, the National Institute of Standards and Technology (NIST) has developed a system to fill the need for faster, better, and cheaper low pressure calibrations (0.65 Pa to 130 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912218

10. 1 Pa TO 15 000 Pa ABSOLUTE MODE COMPARISONS BETWEEN THE NIST ULTRASONIC INTERFEROMETER MANOMETERS AND NON-ROTATING FORCE-BALANCED PISTON GAUGES
Published: 1/11/2010
Authors: Jay H Hendricks, Douglas A Olson
Abstract: The National Institute of Standards and Technology (NIST) Low Pressure Manometry Project maintains and operates primary standard ultrasonic interferometer manometers (UIMs) over the pressure range of 1 mPa to 360 kPa. Over the past decade a new type ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904623



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series